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Characterization of the ZnSe/GaAs Interface by TEM and Spectroscopic Ellipsometry

Published

Author(s)

R. Dahmani, Lourdes Salamanca-Riba, Nhan Van Nguyen, Deane Chandler-Horowitz, B T. Jonker
Proceedings Title
Proc., Materials Research Society Symposium
Volume
280
Conference Location
Boston, MA, USA

Citation

Dahmani, R. , Salamanca-Riba, L. , Nguyen, N. , Chandler-Horowitz, D. and Jonker, B. (1993), Characterization of the ZnSe/GaAs Interface by TEM and Spectroscopic Ellipsometry, Proc., Materials Research Society Symposium, Boston, MA, USA (Accessed February 24, 2024)
Created December 30, 1993, Updated October 12, 2021