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RII Spectroscopy of Trap Levels in Bulk and LPE Hg1-xCdxTe



Chris L. Littler, X. N. Song, Z. Yu, J. L. Elkind, J R. Lowney, David G. Seiler
Semiconductor Science and Technology


Littler, C. , Song, X. , Yu, Z. , Elkind, J. , Lowney, J. and Seiler, D. (1993), RII Spectroscopy of Trap Levels in Bulk and LPE Hg<sub>1-x</sub>CdxTe, Semiconductor Science and Technology (Accessed June 25, 2024)


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Created December 30, 1993, Updated October 12, 2021