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RII Spectroscopy of Trap Levels in Bulk and LPE Hg1-xCdxTe

Published

Author(s)

Chris L. Littler, X. N. Song, Z. Yu, J. L. Elkind, J R. Lowney, David G. Seiler
Citation
Semiconductor Science and Technology
Volume
8

Citation

Littler, C. , Song, X. , Yu, Z. , Elkind, J. , Lowney, J. and Seiler, D. (1993), RII Spectroscopy of Trap Levels in Bulk and LPE Hg<sub>1-x</sub>CdxTe, Semiconductor Science and Technology (Accessed December 9, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created December 30, 1993, Updated October 12, 2021