Seiler, D.
, Mayo, S.
and Lowney, J.
(1993),
Hg1-xCdxTe Characterization Measurements: Current Practice and Future Needs, Journal of Semiconductor Science and Technology, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=12130
(Accessed December 13, 2024)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Hg1-xCdxTe Characterization Measurements: Current Practice and Future Needs
Published
Author(s)
, ,
Citation
Journal of Semiconductor Science and Technology
Volume
8
Pub Type
Journals
Download Paper
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created December 30, 1993, Updated October 12, 2021