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Hg1-xCdxTe Characterization Measurements: Current Practice and Future Needs

Published

Author(s)

David G. Seiler, Santos D. Mayo, J R. Lowney
Citation
Journal of Semiconductor Science and Technology
Volume
8

Citation

Seiler, D. , Mayo, S. and Lowney, J. (1993), Hg1-xCdxTe Characterization Measurements: Current Practice and Future Needs, Journal of Semiconductor Science and Technology, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=12130 (Accessed June 15, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created December 30, 1993, Updated October 12, 2021