TY  - JOUR
AU  - David Seiler
AU  - Santos Mayo
AU  - J Lowney
C2  - Journal of Semiconductor Science and Technology
DA  - 1993-12-31 00:12:00
LA  - en
M1  - 8
PB  - Journal of Semiconductor Science and Technology
PY  - 1993
TI  - Hg1-xCdxTe Characterization Measurements: Current Practice and Future Needs
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=12130
ER  -