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Displaying 57951 - 57975 of 74219

A Bibliography on Apparel Sizing and Related Issues

January 1, 1994
Author(s)
Yung-Tsun T. Lee
Anthropometric data and sizing systems is an important component of apparel quality. Apparel can not be top quality unless it fits the potential wearers satisfactorily. Much research has been conducted on this topic area. Some of these research results are

A Calibrated Atomic Force Microscope

January 1, 1994
Author(s)
T Mcwaid, J Schneir
Atomic force microscope (AFM) is a rapidly emerging measurement technology. As the technology develops, it is being incorporated into industrial research and development, and manufacturing facilities. At present there are no sub-micrometer pitch or sub-ten

A Dimensional Inspection Planning Activity Model

January 1, 1994
Author(s)
Shaw C. Feng
This paper describes an activity model for dimensional inspection planning that bridges the gap between product design and the dimensional measurement of manufactured products. Functionally, this model specifies requirements for developing a part of a

A High Accuracy Micrometer for Diameter Measurements of Cylindrical Standards

January 1, 1994
Author(s)
John R. Stoup, Theodore D. Doiron
NIST has developed a new instrument to measure cylindrical standards including thread wires and plain plug gages. The instrument uses a laser interferometer system which is coupled with an air bearing linear motion slide and precise contact geometry to
Displaying 57951 - 57975 of 74219
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