Suehle, J.
(1994),
Reproducibility of JEDEC Standard Current and Voltage Ramp Test Procedures for Thin-Dielectric Breakdown Characterization, 1993 IIEEE International Integrated Reliability Workshop Final Report, Lake Tahoe, CA
(Accessed May 11, 2025)
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Reproducibility of JEDEC Standard Current and Voltage Ramp Test Procedures for Thin-Dielectric Breakdown Characterization
Published
Author(s)
Proceedings Title
1993 IIEEE International Integrated Reliability Workshop Final Report
Conference Dates
October 24-27, 1993
Conference Location
Lake Tahoe, CA
Pub Type
Conferences
Citation
Issues
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Created December 31, 1994, Updated February 17, 2017