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Reproducibility of JEDEC Standard Current and Voltage Ramp Test Procedures for Thin-Dielectric Breakdown Characterization

Published

Author(s)

John S. Suehle
Proceedings Title
1993 IIEEE International Integrated Reliability Workshop Final Report
Conference Dates
October 24-27, 1993
Conference Location
Lake Tahoe, CA

Citation

Suehle, J. (1994), Reproducibility of JEDEC Standard Current and Voltage Ramp Test Procedures for Thin-Dielectric Breakdown Characterization, 1993 IIEEE International Integrated Reliability Workshop Final Report, Lake Tahoe, CA (Accessed May 29, 2024)

Issues

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Created December 31, 1994, Updated February 17, 2017