Suehle, J.
(1994),
Reproducibility of JEDEC Standard Current and Voltage Ramp Test Procedures for Thin-Dielectric Breakdown Characterization, 1993 IIEEE International Integrated Reliability Workshop Final Report, Lake Tahoe, CA
(Accessed January 22, 2025)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Reproducibility of JEDEC Standard Current and Voltage Ramp Test Procedures for Thin-Dielectric Breakdown Characterization
Published
Author(s)
Proceedings Title
1993 IIEEE International Integrated Reliability Workshop Final Report
Conference Dates
October 24-27, 1993
Conference Location
Lake Tahoe, CA
Pub Type
Conferences
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created December 31, 1994, Updated February 17, 2017