Suehle, J.
, Chaparala, P.
and Messick, C.
(1994),
High Temperature Reliability of Thin Film SiO<sub>2</sub>, Proc., 2nd International High Temperature Electronics Conference, Charlotte, NC, USA
(Accessed May 11, 2025)
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High Temperature Reliability of Thin Film SiO2
Published
Author(s)
, P Chaparala, C. Messick
Proceedings Title
Proc., 2nd International High Temperature Electronics Conference
Conference Dates
June 5-10, 1994
Conference Location
Charlotte, NC, USA
Pub Type
Conferences
Citation
Issues
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Created December 30, 1994, Updated October 12, 2021