Suehle, J.
, Chaparala, P.
and Messick, C.
(1994),
High Temperature Reliability of Thin Film SiO<sub>2</sub>, Proc., 2nd International High Temperature Electronics Conference, Charlotte, NC, USA
(Accessed November 29, 2023)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
High Temperature Reliability of Thin Film SiO2
Published
Author(s)
, P Chaparala, C. Messick
Proceedings Title
Proc., 2nd International High Temperature Electronics Conference
Conference Dates
June 5-10, 1994
Conference Location
Charlotte, NC, USA
Pub Type
Conferences
Citation
Created December 30, 1994, Updated October 12, 2021