@conference{779756,
  author = {John Suehle and P Chaparala and C. Messick},
  title = {High Temperature Reliability of Thin Film SiO<sub>2</sub>},
  year = {1994},
  month = {1994-12-31 00:12:00},
  publisher = {Proc.,  2nd International High Temperature Electronics Conference, Charlotte, NC, USA},
  language = {en},
}