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Displaying 55601 - 55625 of 74357

Efficient piecewise linear approximation of space curves using chord and arc length

June 6, 1996

Author(s)

John A. Horst, I Beichl

Vision, Robotics & Intelligent Systems, Miscellaneous

A Cryogenic Linear Ion Trap for 199 Hg + Frequency Standards

June 5, 1996

Author(s)

J D. Miller, M E. Poitzsch, F C. Cruz, D J. Berkeland, James C. Bergquist, Wayne M. Itano, David J. Wineland

A 100 Ampere, 100 kHz Transconductance Amplifier

June 1, 1996

Author(s)

Owen B. Laug

A 7-Junction Electron Pump: Design and Operation

June 1, 1996

Author(s)

Mark W. Keller, John M. Martinis, Neil M. Zimmerman

A Brief Introduction to XTide

June 1, 1996

Author(s)

David W. Flater

A Low Thermal Guarded Scanner for High Resistance Measurement Systems

June 1, 1996

Author(s)

J. A. Marshall, T. A. Marshall, Dean G. Jarrett, Ronald F. Dziuba

A New Modulation Method for Sensitive Nonlinear Spectroscopy - Application to Molecular Overtones as Visible Frequency References

June 1, 1996

Author(s)

L -. Ma, Jun Ye, P Dub, John L. Hall

Following de Labachelerie, Nadagawa and Ohtsu (Ref. 6), we note the possibility to obtain saturated absoption spectra of a weakly-absorbing gas sample by placing it within an external high-finesse resonator. A principal disadvantage of this approach, the

A New Refractometer by Combining a Variable Length Vacuum Cell and a Double-Pass Michelson Interferometer

June 1, 1996

Author(s)

K Fujii, Edwin R. Williams, Richard L. Steiner

A Separation Method to Overcome the Interference of Calcium on the Uranium Determination by ICP-ES

June 1, 1996

Author(s)

O Andonie zaror, R Soria juarez, E. Zeiller, Rolf L. Zeisler

A Wideband Sampling Voltmeter

June 1, 1996

Author(s)

T. M. Souders, Bryan C. Waltrip, Owen B. Laug, J. P. Deyst

An Active High Voltage Divider with 20-PPM Uncertainty

June 1, 1996

Author(s)

O. Petersons, Eric D. Simmon, Gerald FitzPatrick

An Approach to the Reduction of Hydrocarbon Contamination in the Scanning Electron Microscope

June 1, 1996

Author(s)

Michael T. Postek

The deposition of electron bean-induced specimen contamination in both the transmission (TEM) and scanning electron microscopes (SEM) has remained a problem since the beginning of these forms of microscopy. Generally, sources of SEM contamination can be

An Operator Experience with a Hierarchical Real-Time Constrol System (RCS)

June 1, 1996

Author(s)

Hui-Min Huang

Control, Robotics & Intelligent Systems, Unmanned Systems

Automated Guarded Bridge for Calibration of Multimegohm Standard Resistors

June 1, 1996

Author(s)

Dean G. Jarrett

Calibrating a Dual Six Port ANA With a Single Impedance Standard

June 1, 1996

Author(s)

Ronald A. Ginley

Chemical Inhibition of Methane-Air Diffusion Flame. Final Report. September 15, 1993-September 15, 1995.

June 1, 1996

Author(s)

K Seshadri

The principal objective of this research is to clarify the mechanisms of chemical inhibition of methane-air diffusion flames by CF3Br and CF3H. An experimental, numerical and analytical study is conducted. In inhibited flames at conditions close to flame

Component-Based Handprint Segmentation Using Adaptive Writing Style Model

June 1, 1996

Author(s)

Michael D. Garris

Computer Systems Laboratory/Computing and Applied Mathematics Laboratory Technical Accomplishments, October 1994 through March 1996

June 1, 1996

Author(s)

Elizabeth B. Lennon

Computerized Representations of Manufacturing Resources: Statement of Need and a Proposed Solution

June 1, 1996

Author(s)

James E. Fowler, Mary B. Algeo, Kevin K. Jurrens

The Systems Integration For Manufacturing Applications (SIMA) Program is NIST's coordinating focus for manufacturing activities supporting the High Performance Computing and Communications/Information Infrastructure Technology and Applications initiative

Conformance Testing and Specification Management

June 1, 1996

Author(s)

James A. St Pierre, Selden Stewart, Kevin G. Brady

This is the final report for the second year of a joint project between the National Institute of Standards and Technology (NIST) and SEMATECH. It presents the results from investigation in two areas that were proposed in the first year report: conformance