Kim, J.
, Seiler, D.
, Lancaster, R.
and Reine, M.
(1996),
Electrical Characterization of Very-Narrow-Gap Bulk HgCdTe Single Crystals by Variable Magnetic-Field-Hall Measurements, Journal of Electronic Materials
(Accessed October 13, 2024)
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Electrical Characterization of Very-Narrow-Gap Bulk HgCdTe Single Crystals by Variable Magnetic-Field-Hall Measurements
Published
Author(s)
, , R. A. Lancaster, M. B. Reine
Citation
Journal of Electronic Materials
Volume
25
Issue
8
Pub Type
Journals
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created December 30, 1996, Updated October 12, 2021