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Displaying 51901 - 51925 of 73697

Metal-Insulator-Semiconductor Transmission Line Model

June 1, 1998
Author(s)
Dylan F. Williams
This paper investigates the one-dimensional metal-insulator-semiconductor transmission line. It develops closed-form expressions for equivalent-circuit parameters, compares them to exact calculations, and explores their limitations. It also investigates

Metrology: Impact on National Economy and International Trade

June 1, 1998
Author(s)
Hratch G. Semerjian, Robert L. Watters
The U.S. Federal Government has a strong role in metrology R&D in the U.S because of its importance to the nation's economy and the Constitutional authority given to the National Institute of Standards and Technology (NIST). However, pressures to maintain

Multi-Stage Active Vibration Isolation System

June 1, 1998
Author(s)
S J. Richman, J A. Giaime, David B. Newell, R T. Stebbins, P L. Bender, J E. Faller
The major obstacle to the detection of low-frequency gravitational waves with an earth-based interferometer is seismic noise. The current design of the initial LIGO (Laser Interferometer Gravitational-wave Observatory) receiver, now under construction

Optimizing GMR Spin Valves: The Outlook for Improved Properties

June 1, 1998
Author(s)
William F. Egelhoff Jr., P J. Chen, Cedric J. Powell, D Parks, Robert McMichael, J Judy, D Martien, A. E. Berkowitz, J M. Daughton
The current generation of giant magnetoresistance (GMR) spin valves exhibits performance characteristics which are not quite as good as desired for ultrahigh-density nonvolatile memory applications. This paper addresses the scientific issues underlying the

Preparation and Characterization of Polymer/Dendrimer Blends Progress Report 2/24/97

June 1, 1998
Author(s)
Eric J. Amis, Barry J. Bauer, F I. Groehn, T J. Prosa, Da-Wei Liu, K A. Barnes, C L. Jackson, B D. Viers, Alamgir Karim, Jack F. Douglas
Dendrimer, dendrigraft, and hyperbranched solutions, blends, and interpenetrating polymer networks are characterized by small neutron and x-ray scattering, reflectivity, atomic force microscopy, and transmission electron microscopy.

Process Engineering Data STEP Application Protocol, Version 1.0

June 1, 1998
Author(s)
S W. Kline, Mark E. Palmer, J Fielding, M Gilbert, T Teague, D Witherall
This document specifies the scope and information requirements of the STEP application protocol (AP) for the exchange of process engineering data with a central emphasis on process design and major equipment. It specifies the information required to

Process Measurement Assurance Program for U.S. State Metrology Laboratories

June 1, 1998
Author(s)
J L. Everhart, Georgia L. Harris
This paper describes how the Process Measurement Assurance Program (PMAP) is used in the United States State metrology laboratories (weights and measures laboratories) to provide uniformity among the laboratories in measurement control, uncertainty

Production Systems Engineering: Requirements Analysis for Discrete-Event Simulation

June 1, 1998
Author(s)
Anna Bartolotta, Charles R. McLean, Yung-Tsun T. Lee, Albert W. Jones
This document describes the results of the requirement analysis phase for a neutral interface specification to discrete event simulation software. The interface specification should provide a neutral mechanism capable of describing input data to a discrete

Pulse-Driven Josephson Digital/Analog Converter

June 1, 1998
Author(s)
Samuel Benz, Clark A. Hamilton, Charles J. Burroughs, Todd E. Harvey, Laurie Christian, J. X. Przybysz
We have designed and demonstrated a pulse-driven Josephson digital/analog converter. When used as a programmable voltage standard, this device can synthesize metrologically accurate ac waveforms as well as stable dc voltages. We show through simulations

Requirements Analysis: Process Plan Specification - Workstation Level

June 1, 1998
Author(s)
Kimberley Ellis, Albert T. Jones, Yung-Tsun Lee
The Computer-Aided Manufacturing Engineering (CAME) program is developing a number of integrated software toolkits for design, manufacturing engineering, and production operations. One of these toolkits is the Manufacturing Engineering ToolKit (METK). The

Stability of Multilayer Structures: Capillary Effects

June 1, 1998
Author(s)
Daniel Josell, W Carter, John E. Bonevich
The long term stability of multilayer materials composed of nonreactive, immiscible materials is related to the equilibrium shapes of the individual grains within the layers. These shapes are determined by the free energies and locations of the interfaces

Standard Test Methods and Data for Modeling Crashworthiness

June 1, 1998
Author(s)
Richard J. Fields, Timothy J. Foecke, Roland deWit, G E. Hicho, Lyle E. Levine
This report determines what data is typically needed for models predicting crash behavior, reviews the methods available to obtain such data, and identifies standard test methods that need to be developed to supply these data. The data needed are those
Displaying 51901 - 51925 of 73697
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