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Search Publications

NIST Authors in Bold

Displaying 51876 - 51900 of 73697

Developing a Method to Determine Linewidth Based on Counting the Atom-Spacings Across a Line

June 1, 1998
Author(s)
Richard M. Silver, Carsten P. Jensen, V W. Tsai, Joseph Fu, John S. Villarrubia, E C. Teague
We are developing the instrumentation and prototype samples at NIST to enable the counting of atom-spacings across linewidth features etched in silicon. This is an effort to allow the accurate counting of atom-spacings across a feature in a controlled

Developing Usability Tools and Techniques for Designing and Testing Web Sites

June 1, 1998
Author(s)
Jean C. Scholtz, Sharon J. Laskowski, L L. Downey
Web sites are developed by a wide variety of companies from small one or two person operations to large corportions with entire teams and departments devoted to web development work. Many of the smaller companies have no usability professionals to help

Display Reflectance Model Based on the BRDF

June 1, 1998
Author(s)
Edward F. Kelley, George R. Jones Jr., Thomas Germer
Many flat panel displays (FPDs) permit anti-reflection surface treatments that differ in character from those of traditional cathode-ray-tube displays. Specular reflection models (mirror-like, producing a distinct image) combined with diffuse (Lambertian)

Document Image Recognition and Retrieval: Where Are We?

June 1, 1998
Author(s)
Michael D. Garris
This paper discusses data collected as a result of planning a project to evaluate document recognition and information retrieval technologies. In the process of establishing the project, a Request for Comment (RFC) was widely distributed throughout the

Effect of Regenerator Geometry on Pulse Tube Refrigerator Performance

June 1, 1998
Author(s)
Michael A. Lewis, T Kuriyama, J Xiao, Ray Radebaugh
This paper gives results of the cooling performance of a double-inlet pulse tube refrigerator using various redenerators. The same pulse tube was used for all the experiments and measured 4.76 mm in diameter and 46.2 m in length. A commercial linear

Emerging Network Storage Management Standards for Intelligent Data Storage Subsystems

June 1, 1998
Author(s)
Fernando L. Podio, W Vollrath, J Williams, B Kobler, D Crouse
Sophisticated network storage management applications are rapidly evolving to satisfy a market demand for highly reliable data storage systems with tremendous data storage capacities and performance requirements. To preserve a high degree of data integrity

Evaluation of High-Voltage Impulse Waveforms Using Model-Based Deconvolution

June 1, 1998
Author(s)
Gerald FitzPatrick, Eric D. Simmon, J. Lagnese
Accurate measurement of high voltage (hv) impulse waveforms is of critical importance in the testing of hv apparatus and for fundamental insulation studies. Quantifying the measurement system errors can be performed by following procedures recommended by

Ferromagnetic Resonance Linewidth in Thin Films Coupled to NiO

June 1, 1998
Author(s)
Robert D. McMichael, Mark D. Stiles, P J. Chen, William F. Egelhoff Jr.
The out-of-plane angular dependence of the ferromagnetic resonance linewidth, [Δ] H, has been measured for thin magnetic films coupled to NiO and for uncoupled control films. In the control films, [Δ] is described by nearly angle-independent damping

Fluorescent Probe for Cure Monitoring of Bonding Agent on Surface

June 1, 1998
Author(s)
K Komatsu, Francis W. Wang
The adhesive strength of a composite resin to dentin is greatly influenced by the degree of cure of the bonding agent. Flouorescent probes have often been used for cure monitoring of resins. The purpose of this study is to select a fluorescent probe for

In-Line Multiport Calibration Algorithm

June 1, 1998
Author(s)
Dylan F. Williams, Dave K. Walker
We present a multiport measurement procedure well suited to on-wafer measurement. It can correct multiport measurements with any conventional in-line calibration, including the thru-reflect-line calibration. We demonstrate the procedure in a four-port

Lumped-Element Impedance Standards

June 1, 1998
Author(s)
Dylan F. Williams, Dave K. Walker
We measure the electrical parameters of commercial lumped-element impedance standards manufactured for the calibration of on-wafer probing systems. The standard's impedance depends not only on the standard itself, but also on probe placement, probe

Measurement of Pitch and Width Samples with the NIST Calibrated Atomic Force Microscope

June 1, 1998
Author(s)
Ronald G. Dixson, R Koning, Theodore V. Vorburger, Joseph Fu, V W. Tsai
Because atomic force microscopes (AFMs) are capable of generating three dimensional images with nanometer level resolution, these instruments are being increasingly used in many industries as tools for dimensional metrology at sub- micrometer length scales

Measurements and Modeling of the Microwave Impedance in High-T c Grain-Boundary Josephson Junctions: Fluxon Generation and RF Josephson-Vortex Dynamics

June 1, 1998
Author(s)
Y. M. Habib, C. J. Lehner, D. E. Oates, Leila R. Vale, Ronald H. Ono, G. Dresselhaus, M. Dresselhaus
Measurements and modeling of the microwave-frequency (rf) power dependence of the impedance in Y-Ba-Cu-O thin-film grain-boundary Josephson junctions (jj's) are presented. Microwave impedance measurements were performed using a stripline resonator with an
Displaying 51876 - 51900 of 73697
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