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On-Wafer Millimeter-Wave Characterization

Published

Author(s)

Roger Marks
Proceedings Title
Proc., European GAAS' 98 Symp.
Conference Dates
October 5-6, 1998
Conference Location
Amsterdam, NL

Citation

Marks, R. (1998), On-Wafer Millimeter-Wave Characterization, Proc., European GAAS' 98 Symp., Amsterdam, NL (Accessed July 18, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created October 1, 1998, Updated February 19, 2017