Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications

NIST Authors in Bold

Displaying 47451 - 47475 of 74164

Introduction to ISO 10303 - The STEP Standard for Product Data Exchange

November 1, 2000
Author(s)
Mike Pratt
Since 1984 the International Organization for Standardization (ISO) has been working on the development of a comprehensive standard for the electronic exchange of product data between computer-based product life-cycle systems. Initial concentration has

LINDENS: A program for lineament length and density analysis

November 1, 2000
Author(s)
Antonio M. Casas, Angel Cortes, Adolfo Maestro, M. Asuncion Soriano, Andres Riaguas, Javier Bernal
Analysis of lineaments from satellite images normally includes the determination of their orientation and density. The spatial variation in the orientation and/or number of lineaments must be obtained by means of a network of cells, the lineaments included

MatML: XML for Materials Property Data

November 1, 2000
Author(s)
E F. Begley, C P. Sturrock
This paper will provide a high level overview of MatML, an extensible markup language (XML) for materials property data. MatML is being developed in order to address the problems of interpretation and interoperability that arise when these data are

Measures for Spectral Quality in Low-Voltage X-Ray Microanalysis

November 1, 2000
Author(s)
Dale E. Newbury
Characteristic x-ray production with energetic electrons depends strongly on the overvoltage, the ratio of the incident beam energy to the critical excitation energy for the atomic species of interest. Low voltage x-ray microanalysis (beam energy < 5 keV)

Microcalorimeter Energy Dispersive X-ray Spectrometer for Low Voltage Microanalysis

November 1, 2000
Author(s)
David A. Wollman, John M. Martinis, Sae Woo Nam, Gene C. Hilton, Kent D. Irwin, David A. Rudman, Norman F. Bergren, Steven Deiker, Martin Huber, Dale Newbury
Improved x-ray detector technology continues to be a critical metrological need in the semiconductor industry for contaminant particle analysis 1,2 and for high-spatial-resolution x-ray microanalysis using low-beam-voltage field-emission scanning electron

Modification of the Phase Stability of Polymer Blends by Fillers

November 1, 2000
Author(s)
Alamgir Karim, D W. Liu, Jack F. Douglas, A Nakatani, Eric J. Amis
We investigate the influence of surface modified filler particles on the phase stability of a model blend of polystyrene (PS) and polybutadiene (PB). The upper critical solution cloud point curve of PS/PB is destabilized (upward shift of critical

Morphological Stability of a Binary Alloy: Temperature-Dependent Diffusivity

November 1, 2000
Author(s)
Sam R. Coriell, Geoffrey B. McFadden, S R. Vanaerenbergh
The effect of the temperature dependence of the diffusion coefficient on the morphological stability of a binary alloy during directional solidification is treated by a linear stability analysis. The Soret effect is also included in the analysis. Specific
Displaying 47451 - 47475 of 74164
Was this page helpful?