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NIST Authors in Bold

Displaying 46301 - 46325 of 74175

Fabrication, Derivatization and Applications of Plastic Microfluidic Devices

February 1, 2001
Author(s)
S L. Barker, Michael J. Tarlov, David J. Ross, T J. Johnson, E A. Waddell, Laurie E. Locascio
Control of the polymer surface chemistry is a crucial aspect of development of plastic microfluidic devices. When commercially available plastic substrates are used to fabricate microchannels, differences in the electroosmotic flow mobility (EOF) from

Fiber Optic Flow and Cure Sensing for Liquid Composite Molding

February 1, 2001
Author(s)
Joy P. Dunkers, Joseph~undefined~undefined~undefined~undefined~undefined Lenhart, S R. Kueh, J H. VanZanten, S G. Advani, Richard~undefined~undefined~undefined~undefined~undefined Parnas
The Polymer Composites group at the National Institute of Standards and Technology has efforts in both on-line flow and cure sensing for liquid composite molding. For our flow program, a novel fiber optic real time sensor system has been developed that can

Fire Emulator/Detector Evaluator: Design, Operation, and Performance (NIST SP 965)

February 1, 2001
Author(s)
Thomas G. Cleary, Michelle K. Donnelly, William L. Grosshandler
This paper describes the fire emulator/detector evaluator which was developed by NIST. The FE/DE has proven to be a very flexible design. The main function of the device is to reproduce the environment (temperature, air velocity, aerosol and gas species

Formation of Macropores in Calcium Phosphate Cement Implants

February 1, 2001
Author(s)
Shozo Takagi, Laurence C. Chow
A calcium phosphate cement (CPC) was shown to harden at ambient temperatures and form hydroxyapatite as the only end-product. Animal study results showed showed that CPC resorbed slowly and was replaced by new bone. For some clinical applications, it would

Frontiers of Analytical Metrology for the Silicon Semiconductor Industry

February 1, 2001
Author(s)
Thomas J. Shaffner, David G. Seiler
The grand challenges of the National Technology Roadmap for Semiconductors include affordable scaling, new materials and structures, and yield and reliability. While these encapsulate the high-level perspective and needs of the industry as a whole, there

Gate Oxide Formation under Mild Conditions for Scanning Capacitance Microscopy

February 1, 2001
Author(s)
Duncan McBride, Joseph Kopanski
Scanning Capacitance Microscopy (SCM) can be used to measure doping density in silicon with a spatial resolution of about 10 nm. In order to make such measurements on fabricated devices, the device must be cross-sectioned, and an oxide sufficient to form a

How Interoperability Saves Money

February 1, 2001
Author(s)
Robert E. Chapman
The pressures of competing in the global marketplace are forcing building control companies, equipment and systems manufacturers, energy providers, utiliites, and design engineers to improve performance and reduce costs. One means of meeting this twin

Information Technology Measurement and Testing Activities at NIST

February 1, 2001
Author(s)
David Flater, James E. Fowler, Simon P. Frechette, Craig M. Shakarji, Michael Hogan, Shirley M. Radack, Douglas Montgomery, L Johnson, R Rosenthal, R Mccabe, R Carpenter, Lisa Carnahan, M M. Gray
Our high technology society continues to rely more and more upon sophisticated measurements, technical standards, and associated testing activities. This was true for the industrial society of the 20th century and remains true for the information society

Investigation and Control of Spatial Characteristics of Chamber-Cleaning Plasmas

February 1, 2001
Author(s)
Kristen L. Steffens, Mark A. Sobolewski
Planar laser-induced fluorescence (PLIF) measurements were made to determine 2-D spatial maps of CF2 density as a chemical marker of plasma uniformity in 9%O2/91%CF4 chamber-cleaning plasmas. Measurements were made in the capacitively-coupled Gaseous

Laminar Flow of Four Gases Through a Helical Rectangular Duct

February 1, 2001
Author(s)
Robert F. Berg, S A. Tison
We report measurements and a model of gas flow through a helical duct of rectangular cross section. The measurements on helium, nitrogen, argon, and sulfur hexafluoride yielded molar flow rates from observations of the rate of rise of pressure in a known

Length and Dimensional Measurements at NIST

February 1, 2001
Author(s)
Dennis A. Swyt
This paper reports on the past, present, and future of length and dimensional measurements at NIST. It covers the evolution of the SI unit of length through its three definitions and the evolution of NBS-NIST dimensional measurement from early linescales
Displaying 46301 - 46325 of 74175
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