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Displaying 43376 - 43400 of 74045

Working Group on Atomic Transition Probabilities

July 1, 2002
Author(s)
Wolfgang L. Wiese, Jeffrey R. Fuhr
A literature survey of experimental and theoretical work on atomic transition probabilities of astrophysical interest published during the last 3 years is presented. The important literature references, identified by a running number, are collected by

Worldwide Comparisons of Rockwell Hardness Scales that Use a Diamond Indenter

July 1, 2002
Author(s)
Samuel R. Low III, Jun-Feng Song
The United States has participated in two major worldwide comparisons of Rockwell hardness scales over the past twenty years. In 1983, fourteen countries participated in a comparison of the Rockwell C scale. The latest worldwide comparison was completed in

Gas-Phase Mechanisms of Fire Retardants

June 28, 2002
Author(s)
Gregory T. Linteris
Fire retardants are added to polymers to increase their ignition time and reduce their heat release rates when burning. They are often described as acting either in the condensed-phase or in the gas-phase, with an understanding that often, both modes can

Quantum Computing and Communication

June 28, 2002
Author(s)
Paul E. Black, David R. Kuhn, Carl J. Williams
A quantum computer, if built, will be to an ordinary computer as a hydrogen bomb is to gunpowder, at least for some types of computations. Today no quantum computer exists, beyond laboratory prototypes capable of solving only tiny problems, and many

Controlled Barrier Modification in Nb/NbOx/Ag Metal Insulator Metal Tunnel Diodes

June 15, 2002
Author(s)
Erich N. Grossman, Todd E. Harvey, Carl D. Reintsema
The nonlinear electrical transport properties of metal-insulator-metal (MIM) tunnel diodes based on a barrier of naturally grown niobium oxide have been measured at room temperature and analyzed. In most cases excellent agreement is found between the

A Macro-Micro Motion System for a STM

June 13, 2002
Author(s)
Bradley N. Damazo, James D. Gilsinn, Richard M. Silver, Hui Zhou
As nano-lithography improves, more companies and research groups have the capability to create nano-scale structures. Scanning Tunneling Microscopes (STMs) are commonly used to create these structures and evaluate them afterward. One difficulty is that

Evaluation of Component-Based Reconfigurable Machine Controllers

June 13, 2002
Author(s)
S Kolla, John L. Michaloski, William G. Rippey
The lack of interoperability and integration standards is severely hindering manufacturing productivity. To address this problem, a General Motion Control (GMC) Testbed has been developed at National Institute of Standards and Technology (NIST) with one of

Tying Together Design, Process Planning and Machining with Step-NC Technology

June 13, 2002
Author(s)
Frederick M. Proctor, John L. Michaloski, William P. Shackleford
While simulation has been successful in tying design and process planning into an iterative loop, machining has traditionally been a downstream terminus of the manufacturing cycle. Simulation of machining has proven difficult due to the highly dynamic and

Evaluation Methodologies for Information Management Systems

June 11, 2002
Author(s)
Emile L. Morse
The projects developed under the auspices of the Defense Advanced Research Projects Agency (DARPA) Information Management (IM) program are innovative approaches to tackle the hard problems associated with delivering critical information in a timely fashion

Laser-Focused Nanofabrication: Beating of Two Atomic Resonances

June 10, 2002
Author(s)
E Jurdik, K van, J Hohlfeld, T Rasing, Jabez J. McClelland
We deposit a laser-collimated chromium beam onto a substrate through a laser standing-wave (SW) tuned above the atomic resonance at either of the two 52Cr transitions 7S 3rarr} 7P° 3 at 427.600 nm or 7S 3rarr} 7P° 4 at 425.553 nm. In both these cases the

Group Delay Description for Broadband Pulses

June 7, 2002
Author(s)
M J. Ware, S A. Glasgow, J Peatross
The traditional concept of group delay usually arises in connection with an expansion of the phase delay for an electromagnetic pulse. In this context, the group delay function (evaluated at a single 'carrier' frequency) describes the time required for a

Simulations of Noise-Parameter Uncertainties

June 7, 2002
Author(s)
James P. Randa
This paper reports results for uncertainties obtained using a Monte Carlo simulation of noise-parameter measurements. The simulator permits the computation of the dependence of the uncertainty in the noise parameters on uncertainties in the underlying

Vector Corrected Noise Temperature Measurements

June 7, 2002
Author(s)
Mark H. Weatherspoon, Lawrence P. Dunleavy, Ali Boudiaf, James P. Randa
A new one-port noise temperature measurement technique is presented that uses receiver noise parameters for error correction. Improved accuracy in one-port noise temperature measurements made with commercial systems is demonstrated without using isolators

Repeat Measurements and Metrics for Nonlinear Model Development

June 6, 2002
Author(s)
Catherine A. Remley, Jeffrey A. Jargon, Dominique Schreurs, Donald C. DeGroot, Kuldip Gupta
We develop a method for using metrics in conjunction with repeat measurements to study nonlinear models. We illustrate this procedure by investigating the performance of three types of measurement-based nonlinear circuit models using two different metrics.
Displaying 43376 - 43400 of 74045
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