Postek, M.
(2002),
Calibration of Electron Microscopies: How to Do This, How Often, Pit-falls, and Problems, Microscopy Today
(Accessed December 6, 2024)
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Calibration of Electron Microscopies: How to Do This, How Often, Pit-falls, and Problems
Published
Author(s)
Abstract
This is the highly edited text of a presentation made during the Microscopy and Microanalysis session on core facility management regarding the calibration of electron microscopes. This segment of the presentation was regarding the calibration of scanning electron microscopes and is a compilation of work previously published.Citation
Microscopy Today
Pub Type
Journals
Keywords
accurate, magnification, scanning electron microscope, standard reference materials
Citation
Issues
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Created September 1, 2002, Updated February 19, 2017