Postek, M.
(2002),
Calibration of Electron Microscopies: How to Do This, How Often, Pit-falls, and Problems, Microscopy Today
(Accessed May 5, 2025)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Calibration of Electron Microscopies: How to Do This, How Often, Pit-falls, and Problems
Published
Author(s)
Abstract
This is the highly edited text of a presentation made during the Microscopy and Microanalysis session on core facility management regarding the calibration of electron microscopes. This segment of the presentation was regarding the calibration of scanning electron microscopes and is a compilation of work previously published.Citation
Microscopy Today
Pub Type
Journals
Keywords
accurate, magnification, scanning electron microscope, standard reference materials
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created September 1, 2002, Updated February 19, 2017