Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Calibration of Electron Microscopes: How to Do This, How Often, Pitfalls and Problems

Published

Author(s)

Michael T. Postek

Abstract

This is the highly edited text of a presentation made during the Microscopy and Microanalysis session on core facility management regarding the calibration of electron microscopes. This segment of the presentation was regarding the calibration of scanning electron microscopes and is a compilation of work previously published.
Citation
Microscopy Today

Keywords

accurate, magnifiction, scanning electron microscope, standard reference materials

Citation

Postek, M. (2002), Calibration of Electron Microscopes: How to Do This, How Often, Pitfalls and Problems, Microscopy Today (Accessed December 14, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created September 1, 2002, Updated February 19, 2017