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Displaying 40651 - 40675 of 74095

Radiative Heat Flux Measurement Uncertainty

October 1, 2003
Author(s)
Rodney A. Bryant, C A. Womeldorf, Erik L. Johnsson, Thomas J. Ohlemiller
As part of an effort to characterize the uncertainties associated with heat flux measurements in a fire environment, an uncertainty analysis example was performed using measurement data from a room corner surface products test that followed the guidelines

Recent Progress in Polarization Mode Dispersion Measurement

October 1, 2003
Author(s)
Kent B. Rochford, Paul Leo, D Peterson, Paul A. Williams
Measurement of polarization mode dispersion (PMD) spans from precise component characterization of differential group delay (DGD) to system characterization of mean DGD and dynamic PMD properties. We describe recent advances and issues in these varied

Registration of Range Data from Unmanned Aerial and Ground Vehicles

October 1, 2003
Author(s)
Anthony J. Downs, Rajmohan Madhavan, Tsai Hong Hong
In the research reported in this paper, we propose to overcome the unavailability of GPS using combined information obtained froma scanning LADARrangefinder on an Unmanned Ground Vehicle (UGV) and a LADAR mounted on an Unmanned Aerial Vehicle (UAV) that

Sources of Uncertainty in the Nose-to-Nose Sampler Calibration Method

October 1, 2003
Author(s)
Nicholas Paulter, Donald R. Larson
We analyze the nose-to-nose (ntn) method for use as an accurate sampler calibration method. The variations in the measurement of the sampler impulse response using the ntn method are presented, and the validity of the assertion that the kick-out pulse is

Space-Scale Analysis of Line Edge Roughness on 193 nm Lithography Test Structures

October 1, 2003
Author(s)
Ndubuisi G. Orji, Jayaraman Raja, Theodore V. Vorburger, Xiaohong Gu
Line edge roughness (LER) is a potential showstopper for the semiconductor industry. As the width of patterned line structures decreases, LER is becoming a non-negligible contributor to resist critical dimension (CD) variation. The International Technology

Stoichiometric Preference in Copper-Promoted Oxidative DNA Damage by Ochratoxin A

October 1, 2003
Author(s)
R A. Manderville, W M. Calcutt, J Dai, G Park, I G. Gillman, R E. Noftle, A K. Mohammed, M. Dizdaroglu, H Rodriguez, S A. Akman
The ability of the fungal carcinogen, ochratoxin A (OTA, 1), to facilitate copper-promoted oxidative DNA damage has been assessed using supercoiled plasmid DNA (Form I)/agarose gel electrophoresis and gas chromatography/mass spectrometry with selected-ion

The Effect of Anisotropic Surface Energy on the Rayleigh Instability

October 1, 2003
Author(s)
Katharine F. Gurski, Geoffrey B. McFadden
We determine the linear stability of a rod or wire subject to capillary forces arising from an anisotropic surface energy. The rod is assumed to be smooth with a uniform cross section given by a 2-D equilibrium shape. The stability analysis is based on

Thermal Imaging of Metals in a Kolsky-Bar Apparatus

October 1, 2003
Author(s)
Howard W. Yoon, D Basak, Richard L. Rhorer, Eric P. Whitenton, Timothy J. Burns, Richard J. Fields, Lyle E. Levine
For materials testing at elevated temperatures, we describe the design and the development of a resistively heated Kolsky-bar apparatus. The temperature of the sample is determined by non-contact thermometry and the spatial temperature gradients in the

Thirteenth International Conference on Computer Technology in Welding

October 1, 2003
Author(s)
Thomas A. Siewert, William G. Rippey
The Thirteenth International Conference on Computer Technology in Welding was held June 18, 2003 in Orlando, Florida, under the sponsorship of the American Welding Society, the National Institute of Standards and Technology (NIST), and The Welding Institue

Turnstile Operation Using a Silicon Dual-Gate Single-Electron Transistor

October 1, 2003
Author(s)
Yukinori Ono, Neil M. Zimmerman, Kenji Yamazaki, Yasuo Takahashi
A single-electron turnstile has been demonstrated using a silicon-based dual-gate single-electron transistor (SET). Each gate controls independently the closing and opening of the channel acting as the SET lead, which enables single-electron transfer

Critical Dimension Calibration Standards for ULSI Metrology

September 30, 2003
Author(s)
Richard A. Allen, Michael W. Cresswell, Christine E. Murabito, Ronald G. Dixson, E. Hal Bogardus
NIST and International SEMATECH are developing single-crystal reference materials for use in evaluating and calibrating critical dimension (CD), that is linewidth, metrology tools. Primary calibration of these reference materials uses a high-resolution

Evolution of a Performance Metric for Urban Search and Rescue Robots (2003)

September 30, 2003
Author(s)
Adam S. Jacoff, Brian A. Weiss, Elena R. Messina
This paper discusses the advancement and proliferation of the Reference Test Arenas for Urban Search and Rescue Robots as representative search and rescue environments, which allow objective performance evaluation of mobile robot capabilities. These arenas
Displaying 40651 - 40675 of 74095
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