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Uncertainty Analysis for Spherical Near-Field Measurement



Michael H. Francis, Ronald C. Wittmann


A general approach is introduced for estimating uncertainties in far-field paramenters from spherical near-field measurements. Although the analysis is incomplete at present, we expect that as the measurement radius increases, our results will transform smoothly to the far-field case, where uncertainties depend on the on-axis gain and polarization of the probe and on the measurements in the far-field direction of interest.
Conference Dates
October 19-24, 2003
Conference Location
Irvine, CA, USA
Conference Title
Antenna Measurement Techniques Association


near-field measurements, spherical scanning, uncertainty


Francis, M. and Wittmann, R. (2003), Uncertainty Analysis for Spherical Near-Field Measurement, Antenna Measurement Techniques Association, Irvine, CA, USA, [online], (Accessed June 18, 2024)


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Created October 18, 2003, Updated October 12, 2021