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Uncertainty Analysis for Spherical Near-Field Measurement

Published

Author(s)

Michael H. Francis, Ronald C. Wittmann

Abstract

A general approach is introduced for estimating uncertainties in far-field paramenters from spherical near-field measurements. Although the analysis is incomplete at present, we expect that as the measurement radius increases, our results will transform smoothly to the far-field case, where uncertainties depend on the on-axis gain and polarization of the probe and on the measurements in the far-field direction of interest.
Conference Dates
October 19-24, 2003
Conference Location
Irvine, CA, USA
Conference Title
Antenna Measurement Techniques Association

Keywords

near-field measurements, spherical scanning, uncertainty

Citation

Francis, M. and Wittmann, R. (2003), Uncertainty Analysis for Spherical Near-Field Measurement, Antenna Measurement Techniques Association, Irvine, CA, USA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=31432 (Accessed June 18, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created October 18, 2003, Updated October 12, 2021