U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications

NIST Authors in Bold

Displaying 36326 - 36350 of 74151

Unsupervised Anomaly Detection System Using Next-Generation Router Architecture

October 1, 2005
Author(s)
Richard A. Rouil, Nicolas Chevrollier, Nada T. Golmie
Unlike many intrusion detection systems that rely mostly on labeled training data, we propose a novel technique for anomaly detection based on unsupervised learning and we apply it to counter denial-of-service attacks. Initial simulation results suggest

WEAR: World Engineering Antropometry Resource Website

October 1, 2005
Author(s)
Sanford P. Ressler
This paper demonstrates that, for large-scale tests, the match and non-match similarity scores have no specific underlying distribution function. The forms of these distribution functions require a nonparametric approach for the analysis of the fingerprint

Web Services Quality Testing

October 1, 2005
Author(s)
Jia Zhang, L Zhang
The National Software Reference Library (NSRL) of the U.S. National Institute of Standards and Technology (NIST) collects software from various sources and publishes file profiles computed from this software (such as MD5 and SHA-1 hashes) as a Reference

Wireless Enhancements for Storage Area Networks

October 1, 2005
Author(s)
David W. Griffith, Kotikalapudi Sriram, J Gao, Nada T. Golmie
We propose the creation of a wireless storage area network (SAN) and analyze its benefits. The proposed wireless SAN (WSAN) consists of a SAN switch that is connected to multiple wireless access points (APs) that communicate with the storage devices. This

Zeroing in on a Lead-Free Solder Database

October 1, 2005
Author(s)
Thomas A. Siewert, David R. Smith
The rising interest in lead-free solders creates a need for complete property data on the various lead-free solder compositions. Circuit designers need these data to assess the impact of the transition on product life, and production engineers need these

Effect of Dissolved Air on the Density and Refractive Index of Water

September 30, 2005
Author(s)
Allan H. Harvey, Simon G. Kaplan, John H. Burnett
We consider the effect of dissolved air on the density and the refractive index of liquid water from 0 ¿aC to 50 ¿aC. The density effect is calculated from the best available values of Henry's constants and partial molar volumes for the components of air

The Study of Silicon Stepped Surfaces as Atomic Force Microscope Calib Standards With a Calibrated AFM at NIST

September 29, 2005
Author(s)
V W. Tsai, Theodore V. Vorburger, Ronald G. Dixson, Joseph Fu, R Koning, Richard M. Silver, Edwin R. Williams
Due to the limitations of modern manufacturing technology, there is no commercial height artifact at the sub-nanometer scale currently available. The single-atom steps on a cleaned silicon (111) surface with a height of 0.314 nm, derived from the lattice

GerberTranslator: Moving towards new PCB standards

September 28, 2005
Author(s)
Matthew L. Aronoff, John V. Messina
This paper describes the key features of the NIST-developed software tool called ?GerberTranslator?. GerberTranslator is a software translator which automates the majority of the work in converting a printed circuit board (PCB) described in the industry

The Relation between Crystalline Phase, Electronic Structure and Dielectric Properties in High-K Gate Stacks

September 28, 2005
Author(s)
Safak Sayan, Mark Croft, Nhan Van Nguyen, Tom Emge, James R. Ehrstein, Igor Levin, John S. Suehle, Robert A. Bartynski, Eric Garfunkel
As high permittivity dielectrics approach use in metal-oxide-semiconductor field effect transistor (MOSFET) production, an atomic level understanding of their electronic, and dielectric properties are being rigorously examined. The valence and conduction

Microscale Heat Transfer at Low Temperatures

September 26, 2005
Author(s)
Ray Radebaugh
This paper discusses the fundamentals and applications of heat transfer in small space and time domains at low temperatures. The modern trend toward miniaturization of devices requires a better understanding of heat transfer phenomena in small dimensions

Retrieval System Evaluation

September 26, 2005
Author(s)
C E. Buckley, Ellen M. Voorhees
One of the primary motivations for TREC was to standardize retrieval system evaluation. Prior to TREC, there was little explicit discussion of what constituted a minimally acceptable experimental design, and no hard evidence to support any position. TREC

Simple UML Modeling to Improve the Development of Information Standards

September 24, 2005
Author(s)
Eric D. Simmon, John V. Messina, Arthur Griesser
Streamlining and Bulletproofing the Standards Development Process In the increasingly complex semiconductor fabrication environment capturing and transferring information throughout the product development cycle is critical. As the process of creating

High-accuracy near infrared wavelength and frequency reference developments at NIST

September 23, 2005
Author(s)
William C. Swann, Sarah L. Gilbert, Brian Washburn, Nathan R. Newbury
NIST research on near infrared frequency and wavelength references is presented. A new high accuracy wavelength calibration transfer standard, SRM 2519a, based on molecular absorption lines of H13C14N is described. Research on optical frequency combs
Displaying 36326 - 36350 of 74151
Was this page helpful?