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Search Publications

NIST Authors in Bold

Displaying 9501 - 9525 of 13224

Magnetic tunnel junction-based crossbars: improving neural network performance by reducing the impact of non-idealities

July 13, 2023
Author(s)
William Borders, Nitin Prasad, Brian Hoskins, Advait Madhavan, Matthew Daniels, Vasileia Gerogiou, Tiffany Santos, Patrick Braganca, Mark Stiles, Jabez J. McClelland
… Increasingly higher demand in chip area and power consumption for more sophisticated … (CMOS) greatly reduces the impact of non-idealities in the circuit and performs inference with accuracies nearly …

NIST Mass Spectrometry Data Center Standard Reference Data and Software Tools for Seized Drug Analysis

May 18, 2023
Author(s)
William E. Wallace, Arun Moorthy
… tools provided by the National Institute of Standards and Technology's Mass Spectrometry Data Center (NIST MSDC) are … Each of these data sets and software tools are described in detail with references to the original publications … chromatography – mass spectrometry and by direct analysis in real time (DART) mass spectrometry are given. …

Background and blended spectral line reduction in precision spectroscopy of EUV and x-ray transitions in highly charged ions

March 3, 2023
Author(s)
Yuri Ralchenko, Joseph N. Tan, Aung S. Naing, Galen O'Neil, Paul Szypryt, Dipti Dipti, Grant Mondeel, Roshani Silwal, Alain Lapierre, Steven Blundell, Gerald Gwinner, Antonio Camargo Villari, Endre Takacs
… We report a method in EBIT spectral analysis that reduces signal from … were recorded at the National Institute of Standards and 4 Technology using a grazing incidence spectrometer. First … Background and blended spectral line reduction in precision spectroscopy of EUV and x-ray transitions in …

PSCR 2020_Social Media Incident Streams

October 29, 2020
Author(s)
Ian M. Soboroff
… is posing new challenges for response personnel. In particular, service operators are now expected to monitor … Incident Streams track drives research into solving this technology gap by bringing together academia and industry to …

The Art in Science of MicroTAS 2019

July 28, 2020
Author(s)
Gregory A. Cooksey
… Miniaturized Systems for Chemistry and Life Sciences) held in Basel, Switzerland, brought great opportunities to … Many of the best images were highlighted at the annual Art in Science competition, sponsored by Lab on a Chip and the National Institute of Standards and Technology. This year's competition featured 39 entries, many …

NIST Air Leakage Calculation Tools for Commercial Buildings

December 9, 2019
Author(s)
Lisa C. Ng, Shrestha Som, William S. Dols, Steven J. Emmerich
… 6 % of the total energy consumed by commercial buildings in 2010 (DOE 2014). Air barrier requirements are now included in ASHRAE Standards 90.1 and 189.1. Given the significant … energy use, the National Institute of Standards and Technology (NIST) has been developing tools to better account …

NIST Handbook 44: Specifications, Tolerances, and Other Technical Requirements for Weighing and Measuring Devices (2020 Ed.)

October 30, 2019
Author(s)
Tina Butcher, Gloria Lee, Juana Williams, Breyanna M. Blackwell
… NIST Handbook 44 was first published in 1949, having been preceded by similar handbooks of various designations and in several forms, beginning in 1918. NIST Handbook 44 is … Measures (OWM) of the National Institute of Standards and Technology (NIST). This handbook includes amendments endorsed …

Waveform metrology: Signal measurements in a modulated world

August 3, 2018
Author(s)
Paul D. Hale, Dylan F. Williams, Andrew M. Dienstfrey
… In this work, we review the \full waveform metrology" concept … we introduced at the National Institute of Standards and Technology. Under this paradigm the full waveform and its … one domain to the other, simultaneously capturing both in the description. … Waveform metrology: Signal measurements in a modulated world …

Development of a Cigarette Tobacco Filler Standard Reference Material

September 20, 2017
Author(s)
Lane Sander, Jeanita Pritchett, Laura J. Wood, Brian Lang, Stephen Wise, Matt J. Walters, T. Phillips, M. J. Holman, G. Lee, J. Lisko, B. Lane, L. Valentin, B. Kimbrell, S. Kuklenyik, S. Stanfill, C. Watson
… has been issued by the National Institute of Standards and Technology (NIST) in September 2016 with certified and reference mass fraction …

SI Measurement System Chart

August 24, 2017
Author(s)
Elizabeth J. Benham
… learn about metric measurements as they consider science, technology, engineering, and mathematics (STEM) careers. SI …

Progress on Vacuum-to-Air Mass Calibration System Using Magnetic Suspension to Disseminate the Planck-constant Realized Kilogram

July 31, 2017
Author(s)
Eric C. Benck, Corey A. Stambaugh, Edward C. Mulhern, Patrick J. Abbott, Zeina J. Kubarych
… The kilogram is the unit of mass in the International System of units (SI) and has been … of the International Prototype Kilogram (IPK) since 1889. In the future, a new definition of the kilogram will be based … by necessity, so the National Institute of Standards and Technology (NIST) is developing a mass calibration system in …

Investigation of Unresolved Issues From ATL Temperature Control Module

February 19, 2017
Author(s)
Stephen J. Treado
… and performance evaluations has been conducted in the Temperature Control Module (TCM) for three control system vendors in order to demonstrate their ability to meet the high … temperature control specification for the Advanced Technology Laboratory (ATL) of +/- 0.01 degree Centigrade. …

Broadband Coherent Anti-Stokes Raman Scattering

August 11, 2016
Author(s)
Charles H. Camp
… that provides detailed chemical information at each pixel. In minutes, this technique captures a “hyperspectral” cube … for example, health and disease, cell function and state. In this work, I will provide an overview of BCARS technology, from the basic theory to future directions and …

Comparison of C-14 liquid scintillation counting at NIST and NRC Canada

March 1, 2016
Author(s)
Denis E. Bergeron, Raphael Galea, Lizbeth Laureano-Perez, Brian E. Zimmerman
… Canada (NRC) and the National Institute of Standards and Technology (NIST) has been completed. Two solutions, one … instabilities, the two laboratories achieved accord in their standardizations of both solutions. At the …

Low-Ohmic Resistance Comparison: Measurement Capabilities and Resistor Traveling Behavior

March 1, 2016
Author(s)
Marlin E. Kraft, Randolph E. Elmquist, Gert Rietveld, Jan van der Beek, Alessandro Mortara, Beat Jeckelmann
… Swinden Laboratorium, National Institute of Standards and Technology, and the Federal Office of Metrology (METAS) were … this result. Still, some of the resistors showed steps in value at each transport which likely relates to the …

Using 3D Nanotomography to Visualize Defects in the Fabrication of Superconducting Electronics

September 23, 2015
Author(s)
Aric W. Sanders, Anna E. Fox, Paul D. Dresselhaus
… an important low-power alternative to semiconductors. As in any electronics fabrication, the production of complex … requires many iterations and stringent quality control. In particular post-fabrication metrology of buried circuit … Using 3D Nanotomography to Visualize Defects in the Fabrication of Superconducting Electronics …
Displaying 9501 - 9525 of 13224
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