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Search Publications

NIST Authors in Bold

Displaying 5426 - 5450 of 13218

Effects of temperature and humidity on high-strength p-aramid fibers used in body armor

April 14, 2020
Author(s)
Amy E. Engelbrecht-Wiggans, Faraz A. Burni, Emilien Guigues, Shefei Jiang, Vivian Yu, Thang Huynh, Zois Tsinas, Deborah Jacobs, Amanda Forster
… modes and the degradation rates of the materials used in armor. Despite the best efforts of manufacturers, some … or oxidative environments is expected and may result in the degradation of material properties such as tensile strength. In this work, p-aramid yarns from two manufacturers were …

Tunable Mechanical Anisotropy, Crack Guiding, and Toughness Enhancement in Two-Stage Reactive Polymer Networks

June 13, 2019
Author(s)
Lewis M. Cox, Adrienne K. Blevins, Jasper A. Drisko, Yifu Ding, Callie I. Higgins, Rong Long, Christopher N. Bowman, Jason P. Killgore
… intricate geometric control over printed part geometries in advanced manufacturing processes. However, manufacturing methods … pattern heterogeneity within a continuous polymer network in a manner which may be able to address these deficiencies. … Anisotropy, Crack Guiding, and Toughness Enhancement in Two-Stage Reactive Polymer Networks …

Evaluation of Degradation Models for High Strength p-Aramid Fibres Used in Body Armour

October 1, 2018
Author(s)
Kirk D. Rice, Amy E. Engelbrecht-Wiggans, Emilien J. Guigues, Amanda Forster
… modes and the degradation rates of the materials used in armour. Despite the best efforts of manufacturers, some … or oxidative environments is expected and may result in the degradation of material properties such as tensile strength. In this work, p-aramid yarns from two manufacturers were …

Effects of wafer noise on the detection of 20 nm defects using optical volumetric inspection

February 11, 2015
Author(s)
Bryan M. Barnes, Francois R. Goasmat, Martin Y. Sohn, Hui Zhou, Andras Vladar, Richard M. Silver
… Patterning imperfections in semiconductor device fabrication may either be noncritical … roughness (LER)] or critical, such as defects that impact manufacturing yield. As the sizes of the pitches and linewidths decrease in lithography, detection of the optical scattering from …

Development of a Methodology to Determine Risk of Counterfeit Use

June 5, 2013
Author(s)
Mark Schaffer, Yaw S. Obeng
… The profitability of the counterfeit industry rests in large part on its ability to recognize supply constraints … cycles, economic downturn and recovery, local disruptions in manufacturing due to natural disasters, and lack of proper IP …

IEEE TC-10: Update 2011

July 1, 2011
Author(s)
Nicholas G. Paulter Jr., Thomas E. Linnenbrink, W. B. Boyer, S. J. Tilden, Travis Ellis
… well-defined methods to produce reliable data expressed in clear terms. Measurement instruments need to acquire data …

QOD Standalone Users Guide

December 16, 2009
Author(s)
Julien C. Cuvillier, Katherine C. Morris
… tools produced by NIST's XML Testbed project within the Manufacturing Systems Integration Division at NIST. These tools aid in producing high quality XML schemas using a standards-based approach to manufacturing systems integration. QOD may be used by an XML …

IEEE TC-10: Update 2008

September 22, 2008
Author(s)
Nicholas G. Paulter Jr., Thomas E. Linnenbrink, W. B. Boyer, Robert Graham, S. J. Tilden
… well-defined methods to produce reliable data expressed in clear terms. Measurement instruments need to acquire data …

Identity management standards for product life cycle of electronic parts

September 10, 2008
Author(s)
YaShian Li-Baboud, Eric D. Simmon, Yaw S. Obeng
… The high profit opportunities, the diffused outsourcing of manufacturing and the structure of distribution networks make … end-users to customs and other law enforcement officers. In this presentation, we plan to discuss key concepts for … information sharing for mitigating counterfeiting risks in the product lifecycle of electronic parts. …

Overlay Metrology: Recent Advances and Future Solutions

January 1, 2001
Author(s)
Richard M. Silver, Jay S. Jun, S Fox, Edward A. Kornegay
… levels become increasingly important. Improved manufacturing control over level to level registration has a … is less than 4 nm. No known solutions are indicated in the roadmap for overlay repeatability better than 4 nm. In this article we will discuss the measurement of …

Managing Digital Libraries for Computer-Aided Design

October 1, 2000
Author(s)
William Regli, V Cicirello
… and process archival for distributed design and manufacturing teams. CAD knowledge-bases are vital to … about complex geometric and engineering information. In particular, we focus on archival and reuse of design and manufacturing data for mechatronic systems. This paper …

Urban-Scale Building Air Change Rate Estimation Using Corrected Wind Speeds and Three-Zone Building Modeling

October 31, 2025
Author(s)
Yasemin Usta, William Dols, Guglielmina Mutani
… 30° directional intervals. These modifiers are then used in a three-zone CONTAM model to calculate hourly building air … against measured energy use from residential buildings in Turin, Italy. Results show that replacing constant air … the Mean Absolute Percentage Error by 11 % to 20 %. In particular, the error was reduced from 49 % ± 9 % to 32 % …

Quantitative Analysis of the Crystallinity of CoFeB Layers in Magnetic Random-Access Memory (MRAM) Stacks Using Extended X-ray Absorption Fine Structure Spectroscopy

September 3, 2025
Author(s)
Bruce Ravel, Matthias Gottwald, Christian Lavoie, Jean Jordan-Sweet, Steve Brown, Guohan Hu
… of crystallization of thin CoFeB-based structures used in Spin Transfer Torque Magnetic Random-Access Memory … are also presented. Among the chemical elements tested in the current work, we find zirconium to be the most efficient in enhancing the crystallization of a 2nm thick CoFeB layer. …

2025 NIST GenAI (Pilot): Code Challenge Evaluation Plan

July 16, 2025
Author(s)
Peter Fontana, Yooyoung Lee, Hariharan Iyer, Sonika Sharma
We are launching a pilot for measuring and evaluating unit tests generated by Artificial Intelligence (AI) for testing elementary python code. This pilot will provide an environment that will facilitate the development and improvement of the abilities of

Nanocalorimetry for plasma metrology relevant to semiconductor fabrication

February 4, 2025
Author(s)
John Diulus, Carles Corbella Roca, Feng Yi, David LaVan, Berc Kalanyan, Mark McLean, Lakshmi Ravi Narayan, William Osborn, James Maslar, Andrei Kolmakov
… radicals generated by reactive cold plasmas, typical in plasma cleaning applications. The setup consists of a … thermal masses. By measuring the temperature increase in the active sensor, caused by radical surface recombination … ion or electron fluxes. The system was successfully tested in a hydrogen plasma environment, and key performance metrics …

Automation of Quantum Dot Measurement Analysis via Explainable Machine Learning

January 13, 2025
Author(s)
Daniel Schug, Tyler Kovach, Michael Wolfe, Jared Benson, Sanghyeok Park, J. P. Dodson, Joelle Corrigan, Mark Eriksson, Justyna Zwolak
… the measurements acquired during the tuning process come in the form of images that need to be properly analyzed to … the subsequent tuning steps. By design, features present in such images capture certain behaviors or states of the … any insights into how the device should be adjusted in the case of \textitbad} images. This is because CNNs …

Design, modeling, and fabrication of high frequency Oersted lines for electron spin manipulation in silicon based quantum devices

October 25, 2024
Author(s)
Pradeep Namboodiri, Mark-yves Gaunin, Alessandro Restelli, Ranjit Kashid, Xiqiao Wang, Fan Fei, Brian Courts, FNU Utsav, Vijith Kamalon Pulikodan, Jonathan Wyrick, Richard M. Silver
… an electromagnetic field that drives Rabi oscillations in a quantum dot interface. The frequency of these Rabi … (PCB) and an ESR line that is able to transmit an RF pulse in the 40 GHz regime and induce an oscillating magnetic field … novel design by applying a second symmetrical Oersted line in the opposing direction of the first to act as an antenna …

Advanced Co-simulation Framework for Assessing the Interplay between Occupant Behaviors and Demand Flexibility in Commercial Buildings

September 2, 2024
Author(s)
Zhelun Chen, Jin Wen, Yicheng Li, L James Lo, Gabriel Grajewski, Vance (Wm.) Payne, Steven T. Bushby, Amanda Pertzborn, Zheng O'Neill, Zhiyao Yang, Caleb Calfa
… occupant behaviors. Our findings indicated variations in energy usage and occupant comfort within demand … typical commercial buildings and their HVAC systems in terms of demand flexibility potential under the impact of … Science and Technology for the Built Environment …

ToF-SIMS Analysis of Ultrathin Films and Their Fragmentation Patterns

February 8, 2024
Author(s)
Shin Muramoto, Daniel Graham, David Castner
… of the extracted data become increasingly complex. In this study, plasma polymerization is used to construct ultrathin films that range in thickness from 1 to 20 nm, and time-of-flight secondary … the mass spectrum; cluster induced non-linear enhancement in secondary ion yield is no longer observed; extent of …
Displaying 5426 - 5450 of 13218
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