IEEE TC-10: Update 2008

Published

September 22, 2008

Author(s)

Nicholas G. Paulter Jr., Thomas E. Linnenbrink, W. B. Boyer, Robert Graham, S. J. Tilden

Abstract

There is a world-wide need to standardize terms, test methods, and the computation of performance parameters for devices that generate, measure, and analyze waveforms. Users need to be able to unambiguously specify the device performance required for particular applications. Manufacturers need to be able to unambiguously state the performance of their devices (e.g., instruments, components, etc.). Metrology facilities need to perform calibrations with well-defined methods to produce reliable data expressed in clear terms. Measurement instruments need to acquire data with well-defined methods and present it clearly. Technical Committee 10 (TC-10), the Waveform Generation, Measurement, and Analysis Committee of the IEEE Instrumentation and Measurement (I&M) Society, is tasked to develop standards to address these needs. TC-10 comprises an international group of electronics engineers, mathematicians, professors and physicists with representatives from national metrology laboratories, national science laboratories, component manufacturers, the test instrumentation industry, academia, and end users. The status of the standards maintained by the TC-10 is presented.

Proceedings Title

16th IMEKO TC4 Symposium

Conference Dates

September 22-24, 2008

Conference Location

Florence, IT

Conference Title

Exploring New Frontiers of Instrumentation and Methods for Electrical and Electronic Measurements

Pub Type

Conferences

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Keywords

ADC, DAC, Digitizing Waveform Recorder, IEEE Std 181(TM), IEEE Std 1057(TM), IEEE Std 1658(TM)(Draft), IEEE Std 1696(TM)(Draft), Measurement, Pulse

Citation

Paulter, N. , Linnenbrink, T. , Boyer, W. , Graham, R. and Tilden, S. (2008), IEEE TC-10: Update 2008, 16th IMEKO TC4 Symposium, Florence, IT, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=33130 (Accessed April 25, 2024)