IEEE TC-10: Update 2011

Published

July 1, 2011

Author(s)

Nicholas G. Paulter Jr., Thomas E. Linnenbrink, W. B. Boyer, S. J. Tilden, Travis Ellis

Abstract

There is a world-wide need to standardize terms, test methods, and the computation of performance parameters for devices that generate, measure, and analyze waveforms. Users need to be able to unambiguously specify the device performance required for particular applications. Manufacturers need to be able to unambiguously state the performance of their devices (e.g., instruments, components, etc.). Metrology facilities need to perform calibrations with well-defined methods to produce reliable data expressed in clear terms. Measurement instruments need to acquire data with well-defined methods and present it clearly. Technical Committee 10 (TC-10), the Waveform Generation, Measurement, and Analysis Committee of the IEEE Instrumentation and Measurement (I&M) Society, is tasked to develop standards to address these needs. TC-10 comprises an international group of electronics engineers, mathematicians, professors and physicists with representatives from national metrology laboratories, national science laboratories, and component manufacturers, the test instrumentation industry, academia, and end users.

Proceedings Title

Proceedings of the Joint IMEKO International Workshop on ADC Modeling and IEEE 2011 ADC Form

Conference Dates

June 30-July 1, 2011

Conference Location

Orvieto

Conference Title

Joint IMEKO International Workshop on ADC Modeling and IEEE 2011 ADC Form

Pub Type

Conferences

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Keywords

ADC, DAC, Digitizing Waveform Recorder, IEEE Std181 (TradeMark), IEEE Std 1057(TradeMark), IEEE Std 1658 (TradeMark), (Draft) IEEE Std 1696 (Trademark), Measurement, Pulse

Citation

Paulter, N. , Linnenbrink, T. , Boyer, W. , Tilden, S. and Ellis, T. (2011), IEEE TC-10: Update 2011, Proceedings of the Joint IMEKO International Workshop on ADC Modeling and IEEE 2011 ADC Form, Orvieto, -1, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=908611 (Accessed May 6, 2024)