Nicholas G. Paulter Jr., Thomas E. Linnenbrink, W. B. Boyer, S. J. Tilden, Travis Ellis
There is a world-wide need to standardize terms, test methods, and the computation of performance parameters for devices that generate, measure, and analyze waveforms. Users need to be able to unambiguously specify the device performance required for particular applications. Manufacturers need to be able to unambiguously state the performance of their devices (e.g., instruments, components, etc.). Metrology facilities need to perform calibrations with well-defined methods to produce reliable data expressed in clear terms. Measurement instruments need to acquire data with well-defined methods and present it clearly. Technical Committee 10 (TC-10), the Waveform Generation, Measurement, and Analysis Committee of the IEEE Instrumentation and Measurement (I&M) Society, is tasked to develop standards to address these needs. TC-10 comprises an international group of electronics engineers, mathematicians, professors and physicists with representatives from national metrology laboratories, national science laboratories, and component manufacturers, the test instrumentation industry, academia, and end users.
Proceedings of the Joint IMEKO International Workshop on ADC Modeling and IEEE 2011 ADC Form
June 30-July 1, 2011
Joint IMEKO International Workshop on ADC Modeling and IEEE 2011 ADC Form
, Linnenbrink, T.
, Boyer, W.
, Tilden, S.
and Ellis, T.
IEEE TC-10: Update 2011, Proceedings of the Joint IMEKO International Workshop on ADC Modeling and IEEE 2011 ADC Form, Orvieto, -1, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=908611
(Accessed September 28, 2023)