NOTICE: Due to a lapse in annual appropriations, most of this website is not being updated. Learn more.

Form submissions will still be accepted but will not receive responses at this time. Sections of this site for programs using non-appropriated funds (such as NVLAP) or those that are excepted from the shutdown (such as CHIPS and NVD) will continue to be updated.

U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications

NIST Authors in Bold

Displaying 9601 - 9625 of 73697

A FULLY INTEGRATED MODEL OF INTERDEPENDENT PHYSICAL AND SOCIAL INFRASTRUCTURE SYSTEMS

July 11, 2019
Author(s)
Bruce Ellingwood, John W. van de Lindt, Therese P. McAllister
While many definitions of resilience can be found in the literature and in policy statements, common to these definitions is the notion that resilience is the ability to prepare for and adapt to changing conditions and withstand and recover rapidly from

Comparison of Artificial Intelligence based approaches to cell function prediction

July 11, 2019
Author(s)
Sarala Padi, Petru S. Manescu, Nicholas Schaub, Nathan Hotaling, Carl G. Simon Jr., Peter Bajcsy
Predicting Retinal Pigment Epithelium (RPE) cell functions in stem cell implants using non-invasive bright field microscopy imaging is a critical task for clinical deployment of stem cell therapies. Such cell function predictions can be carried out either

Deformation of the Moving Magnetic Skyrmion Lattice in MnSi under Electric Current Flow

July 11, 2019
Author(s)
D. Okuyama, Markus Bleuel, J. S. White, Qiang Ye, Jeffery R Krzywon, G. Nagy, Z. Q. Im, I. Zivkovic, M. Bartkowiak, H. M. Ronnow, S. Hoshino, J. Iwasaki, N. Nagaosa, A. Kikkawa, Y. Taguchi, Y. Tokura, D. Higashi, J. D. Reim, Y. Nambu, T. J. Sato
Topological defects are found ubiquitously in various kinds of matter, such as vortices in type-II superconductors, and magnetic skyrmions in chiral ferromagnets. While knowledge on the static behavior of magnetic skyrmions is accumulating steadily, their

Increasing Community Resilience Through Improved Lifeline Infrastructure Performance

July 11, 2019
Author(s)
Chris Rojahn, Laurie Johnson, Veronica Cedillos, Thomas O'Rourke, Therese P. McAllister, Steven McCabe
The concept of community resilience is complex and multi-dimensional, relying upon social science, engineering, earth sciences, economics, and other disciplines to improve the way communities prepare for, resist, respond to, and recover from disruptive

RTL-PSC: Automated Power Side-Channel Leakage Assessment at Register-Transfer Level

July 11, 2019
Author(s)
Miao (Tony) He, Jungmin Park, Adib Nahiyan, Apostol Vassilev, Yier Jin, Mark Tehranipoor
Power side-channel attacks (SCAs) have become a major concern to the security community due to their non- invasive feature, low-cost, and effectiveness in extracting secret information from hardware implementation of cryto algorithms. Therefore, it is

Single-Source Multiaxis Cold-Atom Interferometer in a Centimeter-Scale Cell

July 11, 2019
Author(s)
Yun Jhih Chen, Azure L. Hansen, Gregory W. Hoth, Eugene Ivanov, John E. Kitching, Elizabeth A. Donley
Using the technique of point source atom interferometry, we characterize the sensitivity of a multi-axis gyroscope based on free-space Raman interrogation of a single source of cold atoms in a glass vacuum cell. The instrument simultaneously measures the

Complexity and Entropy Representation for Machine Component Diagnostics

July 9, 2019
Author(s)
Srinivasan Radhakrishnan, Yung-Tsun Lee, Sudarsan Rachuri, Sagar Kamarthi
The Complexity-entropy causality plane (CECP) is a parsimonious representation space for time series. It has two dimensions: normalized permutation entropy (Hs) and Jensen-Shannon complexity (Cjs) of a time series. The representation can be used for both

Cybersecurity Framework Smart Grid Profile

July 9, 2019
Author(s)
Jeffrey A. Marron, Avi M. Gopstein, Nadya Bartol, Larry Feldman
The Smart Grid Profile is an initial attempt to apply risk management strategies from the Framework for Improving Critical Infrastructure Cybersecurity (Cybersecurity Framework) to the smart grid. The Profile provides cybersecurity risk management guidance

Information Exposure (IEX): A New Class in the Bugs Framework (BF)

July 9, 2019
Author(s)
Irena Bojanova, Yaacov Yesha, Paul E. Black, Yan Wu
Exposure of sensitive information can be harmful on its own and in addition could enable further attacks. A rigorous and unambiguous definition of information exposure faults can help researchers and practitioners identify them, thus avoiding security

The Manufacturing Cost Guide: A Primer Beta Version 0.1

July 9, 2019
Author(s)
Douglas Thomas
This primer provides an overview in using the Manufacturing Cost Guide. It walks through the software tool and provides documentation on how the estimates are calculated in the tool. This tool estimates the costs in US manufacturing, which can be used to

Building Open Access to Research (OAR) data infrastructure at NIST

July 8, 2019
Author(s)
Gretchen R. Greene
As a National Metrology Institute (NMI), the National Institute of Science and Technology (NIST) scientists, engineers and technology experts conduct research across a full spectrum of physical science domains. This is performed as a public service within

Direct-write Lithiation of Silicon Using a Focused Ion Beam of Li+

July 8, 2019
Author(s)
William R. McGehee, Evgheni Strelcov, Vladimir P. Oleshko, Christopher L. Soles, Nikolai B. Zhitenev, Jabez J. McClelland
Electrochemical processes that govern the performance of lithium ion batteries involve numerous parallel reactions and interfacial phenomena that complicate the microscopic understanding of these systems. As a new way to study the behavior of ion transport

Electron Reflectometry for Measuring Nanostructures on Opaque Substrate

July 8, 2019
Author(s)
Lawrence H. Friedman, Wen-Li Wu
Here, we present a method for measuring dimensions of nanostructures using specular reflection of electrons from an opaque surface. Development of this method has been motivated by measurement needs of the semiconductor industry, but it can also be more

NIST Time and Frequency Bulletin

July 8, 2019
Author(s)
Kathryn R. Stephenson
The Time and Frequency Bulletin provides information on performance of time scales and a variety of broadcasts (and related information) to users of the NIST services.
Displaying 9601 - 9625 of 73697
Was this page helpful?