X-ray computed tomography instrument performance evaluation, Part II: Sensitivity to rotation stage errors

Published

July 11, 2019

Author(s)

Balasubramanian Muralikrishnan, Katharine M. Shilling, Steven D. Phillips, Wei Ren, Vincent Lee, Felix H. Kim

Abstract

The development of standards for evaluating the performance of X-ray computed tomography instruments is ongoing within ASME and ISO working committees. A key challenge in developing documentary standards is to identify test procedures that are sensitive to known error sources. In part I of this work, we described the effect of geometry errors associated with the detector and determined their influence on sphere center-to-center distance errors and sphere form errors for spheres located in the tomographically reconstructed measurement volume. We also introduced a new method, the single point ray tracing method, to efficiently perform the distance and form error computations and presented data validating the method. In this second part, we describe the effect of errors associated with the rotation stage on sphere center-to- center distance errors and sphere form errors for spheres located in the tomographically reconstructed measurement volume. We recommend optimal sphere center locations that are most sensitive to rotation stage errors, for consideration by documentary standards committees in the development of test procedures for performance evaluation.

Citation

Journal of Research (NIST JRES) -

Volume

124

NIST Pub Series

Journal of Research (NIST JRES)

Pub Type

NIST Pubs

Download Paper

https://doi.org/10.6028/jres.124.015

Local Download

Keywords

cone-beam, distance error, documentary standards, form error, geometry errors, performance evaluation, radiograph-based method, sensitivity analysis, single point ray tracing method, X- ray computed tomography

Citation

Muralikrishnan, B. , Shilling, K. , Phillips, S. , Ren, W. , Lee, V. and Kim, F. (2019), X-ray computed tomography instrument performance evaluation, Part II: Sensitivity to rotation stage errors, Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/jres.124.015 (Accessed April 26, 2024)