TY - GEN AU - Balasubramanian Muralikrishnan AU - Katharine Shilling AU - Steven Phillips AU - Wei Ren AU - Vincent Lee AU - Felix Kim C2 - Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD DA - 2019-07-11 DO - https://doi.org/10.6028/jres.124.015 LA - en M1 - 124 PB - Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD PY - 2019 TI - X-ray computed tomography instrument performance evaluation, Part II: Sensitivity to rotation stage errors ER -