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Information Exposure (IEX): A New Class in the Bugs Framework (BF)
Published
Author(s)
Irena Bojanova, Yaacov Yesha, Paul E. Black, Yan Wu
Abstract
Exposure of sensitive information can be harmful on its own and in addition could enable further attacks. A rigorous and unambiguous definition of information exposure faults can help researchers and practitioners identify them, thus avoiding security failures. This paper describes Information Exposure (IEX), a new class in the Bugs Framework (BF). The BF comprises rigorous definitions and (static) attributes of fault classes, along with their related dynamic properties, such as proximate and secondary causes, consequences and sites. We use this new BF class to analyze specific vulnerabilities and provide clear descriptions. We also discuss lessons we learned that will help create additional BF classes.
Proceedings Title
2019 IEEE 43rd Annual Computer Software and Applications Conference (COMPSAC)
Bojanova, I.
, Yesha, Y.
, Black, P.
and Wu, Y.
(2019),
Information Exposure (IEX): A New Class in the Bugs Framework (BF), 2019 IEEE 43rd Annual Computer Software and Applications Conference (COMPSAC), Milwaukee, WI, US, [online], https://doi.org/10.1109/COMPSAC.2019.00086, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=927491
(Accessed October 9, 2025)