U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Advanced communications

Search Publications

Search Title, Abstract, Conference, Citation, Keyword or Author
  • Published Date
Displaying 376 - 400 of 762

Towards Standardized Waveguide Sizes and Interfaces for Submillimeter Wavelengths

March 22, 2010
Author(s)
Ronald A. Ginley, Dylan Williams, N M. Ridler, J L. Hesler, Anthony R. Kerr, R D. Pollard
This paper describes an activity that has begun recently to develop an international standard for rectangular metallic waveguides and their interfaces for frequencies of 110 GHz and above. The IEEE's Microwave Theory and Techniques Society (MTT-S) is

Interoperability Test of IEEE 1451.5 Standard-Based Wireless Sensors

March 13, 2010
Author(s)
Kang B. Lee, Yuyin Song
The Institute of Electrical and Electronics Engineers (IEEE) 1451 standard provides plug-and-play capability of smart transducers (sensors and actuators). Plug-and-play is an important aspect of interoperability, which is the ability of two or more systems

How Accurate is a Radio Controlled Clock?

March 1, 2010
Author(s)
Michael A. Lombardi
This paper discusses the factors that determine the accuracy of radio controlled clocks. The topics covered including the accuracy of the time signal station, path delay, synchronization errors, and the time error that accumulates between synchronizations.

Resistivity Dominated by Surface Scattering in Sub-50 nm Cu Wires

January 25, 2010
Author(s)
Rebekah L. Graham, Glenn Alers, Thomas Mountsier, N. Shamma, S. Dhuey, R. H. Cabrini, Roy H. Geiss, David T. Read, S. Peddeti
The electron scattering mechanisms in sub-50nm copper lines were investigated to understand the extendibility of copper interconnects when the line width or thickness is less than the mean free path. Electron-beam lithography and a dual hardmask approach

Molecular transistors scrutinized

December 23, 2009
Author(s)
James G. Kushmerick
Transistors have been made from single molecules, where the flow of electrons is controlled by modulating the energy of the molecular orbitals. Insight from such systems could aid the development of future electronic devices.

Nanoelectronic Fabrication with Flip Chip Lamination

December 15, 2009
Author(s)
Mariona Coll Bau, Curt A. Richter, Christina Hacker
Nanoelectronic fabrication with Flip chip lamination Mariona Coll, CA Richter, CA Hacker, Colloquium Catalan Institute of Nanoscience and Nanotechnology CIN2, Barcelona Spain, Dec 2009.

Chemical Science and Technology Laboratory (CSTL) 2009 Annual Report

November 17, 2009
Author(s)
Willie E. May, Richard R. Cavanagh, Dianne L. Poster, Michael D. Amos
CSTL is entrusted with building, sustaining, and maximizing the chemical measurement system that is criticial to chemical technological innovation, economic competitiveness and new job growth for the benefit of the Nation.

Fabrication with Flip-Chip Lamination

November 15, 2009
Author(s)
Mariona Coll Bau, Curt A. Richter, Christina Hacker
Fabrication with Flip-Chip Lamination , Mariona Coll, DR Hines, CA Richter, CA Hacker, Nanotechnology colloquium, Wake Forest University, 11-09.

Fabrication with Flip-Chip Lamination

October 15, 2009
Author(s)
Mariona Coll Bau, Curt A. Richter, Christina Hacker
Fabrication with Flip-Chip Lamination , Mariona Coll, DR Hines, CA Richter, CA Hacker, MRSEC surface physics colloquium, University of Maryland, College Park, 10-09.

Adhesion, Copper Voiding, and Debonding Kinetics of Copper/Dielectric Diffusion Barrier Films

October 13, 2009
Author(s)
Ryan P. Birringer, Roey Shaviv, Thomas Mountsier, Jon Reid, Jian Zhou, Roy H. Geiss, David T. Read, Reinhold Dauskardt
Effects of the chemistry of electroplated copper films on stress-induced voiding and adhesion between the films and a SiN barrier layer are reported. The void density as observed by scanning electron microscopy decreased markedly with increasing Cu purity

High-Voltage Capacitance Measurement System for SiC Power MOSFETs

September 24, 2009
Author(s)
Parrish Ralston, Tam H. Duong, Nanying Yang, David W. Berning, Colleen E. Hood, Allen R. Hefner Jr., Kathleen Meehan
Adequate modeling of a power MOSFET is dependent on accurate characterization of the inter-electrode capacitances. With the advent of high voltage silicon carbide (SiC) power MOSFETs, it has become important to develop a measurement system that can perform

Outdoor-to-Indoor Channel Measurements and Models

September 1, 2009
Author(s)
Catherine A. Remley, Christopher L. Holloway, David W. Matolak
This document reports on wireless channel measurements and models for outdoor to indoor propagation environments. Although there have been a number of publications that have recently appeared on this topic, e.g., [1], [2], and references therein, the

Nanoscale Measurements with a Through-Focus Scanning-Optical-Microscope

July 15, 2009
Author(s)
Ravikiran Attota, Richard M. Silver, Thomas A. Germer
We present a novel optical technique that produces nanometer dimensional measurement sensitivity using a conventional optical microscope, by analyzing through-focus scanning-optical-microscope (TSOM) images obtained at different focus positions. In

Flexible Solution-Processed Memristors

June 3, 2009
Author(s)
Nadine E. Gergel-Hackett, Behrang H. Hamadani, B Dunlap, John S. Suehle, Curt A. Richter, Christina A. Hacker, David J. Gundlach
We have fabricated physically flexible nonvolatile memory devices using inexpensive, room-temperature, solution processing. The behavior of these devices is consistent with that of a memristor device, the missing fourth circuit element theoretically

Uncertainty Analysis for Noise-Parameter Measurements at NIST

April 9, 2009
Author(s)
James P. Randa
The uncertainty analysis is presented for NIST measurements of noise parameters of amplifiers and transistors, in both connectorized (coaxial) and on-wafer environments. We treat both the X-parameters, which are based on the wave representation of the

Word-synchronous linear optical sampling of 40 Gb/s QPSK signals

March 20, 2009
Author(s)
Tasshi Dennis, Paul A. Williams, Ian R. Coddington, Nathan R. Newbury
We demonstrate word-synchronous measurements of QPSK format 40 Gb/s PRBS signals using linear optical sampling with a precision time-base, which allows us to average waveforms and distinguish between signal distortion and noise in eye diagrams.

Measurements of Metamaterial-Inspired, Electrically Small Antenna Systems

March 2, 2009
Author(s)
Christopher L. Holloway, John M. Ladbury, Richard Ziolkowski, Peng Jin, Chia-Ching Lin
The paper discusses the analysis and measurements of electrical small antennas. The antennas discussed here are based on antenna designed from metamaterial inspired concepts. An electromagnetic reverberation chamber is used for the test of the antennas. A

Synchronization monitoring of I/Q data and pulse carving misalignment for a parallel-type 20-Gb/s RZ-DQPSK transmitter by measuring RF clock tone/low frequency power

December 15, 2008
Author(s)
Jeffrey A. Jargon, Xiaoxia Wu, Laurie Christian, Bo Zhang, Wei-Ren Peng, Jeng-Yuan Yang, Lin Zhang, Scott Nuccio, Loukas Paraschis, Alan Willner
We experimentally demonstrate a technique for monitoring the time misalignment of in-phase/quadrature (I/Q) data streams and pulse carver/data in a 20-Gb/s return-to-zero differential quadrature phase-shift-keying (RZ-DQPSK) transmitter. By measuring the

A robust algorithm for eye-diagram analysis

November 1, 2008
Author(s)
Jeffrey A. Jargon, Paul D. Hale, Chih-Ming Wang
We present a new method for analyzing eye diagrams that always provides a unique solution by making use of a robust, least-median-of-squares (LMS) location estimator. In contrast to commonly used histogram techniques, the LMS procedure is insensitive to

Multisine Signals for Wireless System Test and Design

June 13, 2008
Author(s)
Catherine A. Remley, Nuno Carvalho, Dominique Schreurs, Kevin Gard
We discuss the use of multisine test signals for system verification and model development in the laboratory. We highlight the utility of multisine excitation for test and verification of telecommunication systems, where nonlinear elements such as power

Uncertainty Analysis for Noise-Parameter Measurements

June 8, 2008
Author(s)
James P. Randa
A brief summary is presented for the uncertainty analysis for measurements of noise parameters of amplifiers and transistors, in both connectorized (coaxial) and on-wafer environments. We treat both the X-parameters, which are based on the wave
Was this page helpful?