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Displaying 351 - 375 of 762

Selective Pixel Interpolation for Spatial Error Concealment

June 1, 2011
Author(s)
Hamid Gharavi, Yi Ge, Bo Yan, Kairan Sun
This paper proposes an effective algorithm for spatial error concealment with accurate edge detection and partitioning interpolation. Firstly, a new method is used for detecting possible edge pixels and their matching pixels around the lost block. Then

Fluid interactions with metafilm/metasurfaces for tuning, sensing, and microwave assisted chemical processes

May 25, 2011
Author(s)
Joshua A. Gordon, Christopher L. Holloway, James C. Booth, James R. Baker-Jarvis, David R. Novotny, Sung Kim, Yu Y. Wang
In this paper we demonstrate tunability of a metafilm, which is the two-dimensional equivalent of a metamaterial, also referred to as a metasurface, by changing the permittivity in a micro-fluidic channel that interacts with the metafilm. Numerical

Noise-Parameter Measurements with a Reflection Type Phase Shifter

November 1, 2010
Author(s)
Dazhen Gu, Dave K. Walker, James P. Randa
We report a miniaturized phase shifter operating in the frequency range from 5 GHz to 7 GHz for noise-parameter extraction. Such a tunable solid-state unit represents a significant reduction in the size and mass as a source-pull component, compared to its

Modeling Smart Grid Applications with Co-Simulation

October 5, 2010
Author(s)
Timothy Godfrey, Mullen Sara, Roger C. Dugan, Craig Rodine, David W. Griffith, Nada T. Golmie
Analysis of complex Smart Grid applications require simulation of communications networks and the power system. Analytical models of the communication systems provide a tool for examining the aggregate behavior of the system. An event level analysis in the

Editorial: Message From the Outgoing Editors

September 10, 2010
Author(s)
Dylan F. Williams
Some four years ago, we took the responsibility for editing this TRANSACTIONS. Our editorial duties have now ended. It has been a privilege and honor to serve our readers and our authors.

Conductive Carbon Nanotubes for Semiconductor Metrology

August 10, 2010
Author(s)
Joseph J. Kopanski, Victor H. Vartanian, Vladimir Mancevski, Phillip D. Rack, Ilona Sitnitsky, Matthew D. Bresin
This paper presents an evaluation of e-beam assisted deposition and welding of conductive carbon nanotube (c-CNT) tips for electrical scanning probe microscope measurements. Variations in CNT tip conductivity and contact resistance during fabrication were

REFLECTIVITY STUDIES OF PASSIVE MICROWAVE CALIBRATION TARGETS AND ABSORPTIVE MATERIALS

July 30, 2010
Author(s)
Dazhen Gu, Amanda Cox, Derek A. Houtz, Dave K. Walker, James P. Randa, Robert L. Billinger
We report the characterization of blackbody reflections as a part of the recent progress on the development of brightness standards for microwave remote sensing at National Institute of Standards and Technology (NIST).Three blackbody targets at variable

Examining the True Effectiveness of Loading a Reverberation Chamber

July 29, 2010
Author(s)
Jason Coder, John M. Ladbury, Christopher L. Holloway, Kate Remley
In this paper we explore how placing the same amount of absorber in different locations within a reverberation chamber can have different loading effects. This difference can have a significant impact on measurement reproducibility, both for measurements

COMPARISON OF NEAR-FIELD METHODS AT NIST K. MacReynolds, M.H. Francis and D. Tamura

July 14, 2010
Author(s)
Katherine MacReynolds, Michael H. Francis, Douglas T. Tamura
A comparison of the planar, spherical and cylindrical near-field techniques was completed at the National Institute of Standards and Technology (NIST) for a Ku-band Cassegrain reflector antenna. This paper discusses the measurement results for the near-to

Calibration service for instruments that measure laser beam diameter

July 1, 2010
Author(s)
Shao Yang
This document describes the calibration service for instruments that measure laser beam diameter. An overview of the measurement procedures, measurement system, and uncertainty analysis is presented. A sample measurement report is included in this document

Electro-optic sampling for traceable high-speed electrical measurements

May 23, 2010
Author(s)
Paul D. Hale, Dylan F. Williams
We will describe how the complex frequency response of a high-speed photodiode is calibrated by use of electro-optic sampling. Our uncertainty analysis includes a unique covariance-matrix based method that allows us to transform uncertainties between the
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