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Displaying 326 - 350 of 776

Hybrid quantum-well system for wavelength-channel selection

June 28, 2013
Author(s)
Lu Deng, Edward W. Hagley, Chengjie Zhu
We consider a hybrid quantum-well structure consisting of regions whose properties alternate between active Raman gain and electromagnetically induced transparency. We present both analytical and numerical results that indicate a large light beam defection

Traceability for Aerosol Electrometer in the fA Range

June 1, 2013
Author(s)
Dean G. Jarrett, Miles Owen
Described here are the configurations and procedures used to provide traceability to electrical standards for an aerosol electrometer calibration in the range ± 20 fA to ± 40 fA. The technique used here simulated the condition of a current induced when

The Forthcoming IEEE Standard 1696 on Test Methods for Characterizing Circuit Probes

May 6, 2013
Author(s)
Nicholas Paulter, John Jendzurski, Mike McTigue, Bill Hagerup, Thomas E. Linnenbrink
The Technical Committee 10 (TC10) of the IEEE Instrumentation and Measurement Society initiated a new standards activity in 2006 for the development of test methods to characterize the performance of circuit probes. This standard contains a set of

NIST Handbook 150-11, NVLAP Electromagnetic Compatibility and Telecommunications

April 25, 2013
Author(s)
Bethany E. Hackett, Bradley Moore, Dennis G. Camell
NIST Handbook 150-11, NVLAP Electromagnetic Compatibility and Telecommunications, presents the technical requirements and guidance for the accreditation of laboratories under the NVLAP Electromagnetic Compatibility and Telecommunications (ECT) LAP. It is

Nonlinear acoustic effects in multilayer ceramic capacitors

January 25, 2013
Author(s)
Ward L. Johnson, Sudook A. Kim, Timothy P. Quinn, Grady S. White
Nonlinear resonant acoustics was explored as an approach for nondestructively evaluating the susceptibility of BaTiO3-based multilayer ceramic capacitors to electrical failure during service. The acoustic nonlinearity was characterized through measurements

NIST Handbook 150-11, NVLAP Electromagnetic Compatibility and Telecommunications

December 21, 2012
Author(s)
Bethany E. Hackett, Bradley Moore, Dennis G. Camell
NIST Handbook 150-11, NVLAP Electromagnetic Compatibility and Telecommunications, presents the technical requirements and guidance for the accreditation of laboratories under the NVLAP Electromagnetic Compatibility and Telecommunications (ECT) LAP. It is

Silicon Micromachines for Fun and Profit

December 12, 2012
Author(s)
David Bishop, Flavio Pardo, Cris Bolle, Randy Giles, Vladimir Aksyuk
Over the last decade or so a group of us, while working at Bell Labs, have been able to develop a large number of silicon micromachines for a wide range of applications. In this article, which is part of a special volume to celebrate the career of

Third-Round Report of the SHA-3 Cryptographic Hash Algorithm Competition

November 15, 2012
Author(s)
Shu-jen H. Chang, Ray A. Perlner, William E. Burr, Meltem Sonmez Turan, John M. Kelsey, Souradyuti Paul, Lawrence E. Bassham
The National Institute of Standards and Technology (NIST) opened a public competition on November 2, 2007 to develop a new cryptographic hash algorithm - SHA-3, which will augment the hash algorithms specified in the Federal Information Processing Standard

On the Nonlinearity of Maximum-length NFSR Feedbacks

August 14, 2012
Author(s)
Meltem Sonmez Turan
Linear Feedback Shift Registers (LFSRs) are the main building block of many classical stream ciphers; however due to their inherent linearity, most of the LFSR-based designs do not offer the desired security levels. In the last decade, using Nonlinear

Simple Test and Modeling of RFID Tag Backscatter

July 1, 2012
Author(s)
Daniel G. Kuester, David R. Novotny, Jeffrey R. Guerrieri, Aniwar Ibrahim, Zoya Popovic
We consider here worst-case analysis of backscatter from passive radio frequency identification (RFID) tags. The basis is a figure of merit "B" to relate link power at reader ports to tag circuit parameters. A minimum bound for received monostatic

SIM.EM-S5 Voltage, Current and Resistance Comparison

June 1, 2012
Author(s)
Harold Sanchez, Lucas Di Lillo, Gregory Kyriazis, Rodrigo Ramos, Randolph Elmquist, Nien F. Zhang
This paper reports the results of the second Interamerican Metrology System (SIM) comparison on calibration of digital multimeters, performed for strengthening the interaction among National Metrology Institutes (NMIs) and for establishing the degree of
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