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The Forthcoming IEEE Standard 1696 on Test Methods for Characterizing Circuit Probes

Published

Author(s)

Nicholas Paulter, John Jendzurski, Mike McTigue, Bill Hagerup, Thomas E. Linnenbrink

Abstract

The Technical Committee 10 (TC10) of the IEEE Instrumentation and Measurement Society initiated a new standards activity in 2006 for the development of test methods to characterize the performance of circuit probes. This standard contains a set of performance parameters that describe probe performance along with a test method for each of these parameters. All test methods consider both single-ended and differential probes. The probes may be either stand alone, that is, they are not necessarily constrained to operate with one model of waveform recorder (such as an oscilloscope), or a probe-scope system, where the probe is designed by the probe manufacturer to work with one or two models of oscilloscopes. The probes considered in this standard are all active high-input impedance devices. Both static and dynamic signal measuring performance parameters are considered in the P1696. The crux to accurate measurements of the dynamic signal measurement properties of the probe is a quality test fixture, which is described in the standard.
Citation
IEEE Transactions on Instrumentation and Measurement

Keywords

circuit probe, differential, probe-scope system, single-ended, stand-alone probe, test fixture

Citation

Paulter, N. , Jendzurski, J. , McTigue, M. , Hagerup, B. and Linnenbrink, T. (2013), The Forthcoming IEEE Standard 1696 on Test Methods for Characterizing Circuit Probes, IEEE Transactions on Instrumentation and Measurement, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=912599 (Accessed January 19, 2022)
Created May 5, 2013, Updated October 12, 2021