TY  - JOUR
AU  - Nicholas Paulter
AU  - John Jendzurski
AU  - Mike McTigue
AU  - Bill Hagerup
AU  - Thomas Linnenbrink
C2  - IEEE Transactions on Instrumentation and Measurement
DA  - 2013-05-06 00:05:00
LA  - en
PB  - IEEE Transactions on Instrumentation and Measurement
PY  - 2013
TI  - The Forthcoming IEEE Standard 1696 on Test Methods for Characterizing Circuit Probes
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=912599
ER  -