Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Electro-optic sampling for traceable high-speed electrical measurements

Published

Author(s)

Paul D. Hale, Dylan F. Williams

Abstract

We will describe how the complex frequency response of a high-speed photodiode is calibrated by use of electro-optic sampling. Our uncertainty analysis includes a unique covariance-matrix based method that allows us to transform uncertainties between the time and frequency domains. Once calibrated, the photodiode can be used as a known source, providing traceability to both time- and frequency-domain based equipment, including oscilloscopes, vector signal generators, vector signal analyzers, and large signal network analyzers.
Proceedings Title
IEEE MTT 2010 International Microwave Symposium
Conference Dates
May 23-28, 2010
Conference Location
Anaheim, CA
Conference Title
IEEE MTT 2010 International Microwave Symposium
Workshop WMF "Ultra-high speed microwave and photonic devices and systems: How will they be tested"

Keywords

Electro-optic sampling, oscilloscope, photodiode

Citation

Hale, P. and Williams, D. (2010), Electro-optic sampling for traceable high-speed electrical measurements, IEEE MTT 2010 International Microwave Symposium, Anaheim, CA (Accessed December 8, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created May 23, 2010, Updated February 19, 2017