Skip to main content

NOTICE: Due to a lapse in annual appropriations, most of this website is not being updated. Learn more.

Form submissions will still be accepted but will not receive responses at this time. Sections of this site for programs using non-appropriated funds (such as NVLAP) or those that are excepted from the shutdown (such as CHIPS and NVD) will continue to be updated.

U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications

Search Title, Abstract, Conference, Citation, Keyword or Author
  • Published Date
Displaying 201 - 225 of 332

Recent Developments in Millimeter and Submillimeter Metrology at NIST

June 30, 2011
Author(s)
Ronald A. Ginley
The millimeter and submillimeter frequency ranges are becoming very important to today’s electronics, security and communication industries. NIST has undertaken a research program to aggressively pursue this area. This paper will cover the millimeter

Pulse Metrology, Part 1

June 1, 2011
Author(s)
Nicholas G. Paulter Jr., Donald R. Larson
Pulse metrology refers to the science of the measurement of pulses, which are transient phenomena. This article describes concepts important for pulse metrology, namely, reproducibility and repeatability of measurement, measurement uncertainty, and

Present Estimates of the Differences Between Thermodynamic Temperatures and the ITS-90

January 29, 2011
Author(s)
Joachim Fischer, M. DePodesta, K. D. Hill, Michael R. Moldover, Laurent Pitre, R. Rusby, Peter Steur, Osamu Tamura, R. White, L. Wolber
In 2005, the Consultative Committee for Thermometry (CCT) recommended the creation of a Mise en pratique for the definition of the kelvin and envisioned that future versions of the Mise en pratique would recommend values of the differences between

A Compact Variable-Temperature Broadband Series-Resistor Calibration

January 1, 2011
Author(s)
Nathan D. Orloff, Jordi Mateu, Arkadiusz C. Lewandowski, Eduard Rocas, Joshua P. King, Dazhen Gu, Juan C. Collado Gomez, Ichiro Takeuchi, Xiaoli Lu, James C. Booth
We present a method to obtain a broadband on wafer calibration from 45 MHz to 40 GHz for variable temperature, which requires three standards: a thru-reflect, and series-resistor. The maximum error of this technique compared to a benchmark 9 standard

Superconducting multiplexer filter bank for a frequency-selective power limiter

December 23, 2010
Author(s)
Eduard Rocas, Alberto Padilla, Jordi Mateu, Juan C. Collado Gomez, James C. Booth, Juan M. O'Callaghan
This work proposes a superconducting multiplexer filter bank configuration to be used as a frequency-selective power limiter. The proposed configuration limits narrowband high power signals without degrading the signal performance in the remainder

Modeling of Self-Heating Mechanism in the Design of Superconducting Limiters

December 10, 2010
Author(s)
Eduard Rocas, Juan C. Collado Gomez, Jordi Mateu, Nathan D. Orloff, James C. Booth
This work proposes a modeling method to simulate how temperature rise, due to power dissipation, affects the performance of a HTS limiter. The spatial temperature rise distribution across and along a HTS transmission line is determined by heat generation

A gas pressure scale based on primary standard piston gauges

December 6, 2010
Author(s)
Douglas A. Olson, Robert G. Driver, Walter J. Bowers Jr.
The National Institute of Standards and Technology has redefined its gas pressure scale, up to 17 MPa, based on two primary standard piston gauges. The primary standard piston gauges are 35.8 mm in diameter and operate from 20 kPa to 1 MPa. Ten secondary

Broadband Measurements of Nanofiber Devices: Repeatability and Random Error Analysis

November 30, 2010
Author(s)
Thomas M. Wallis, Atif A. Imtiaz, SangHyun S. Lim, Pavel Kabos, Kichul Kim, Paul Rice, Dejan Filipovic
On-wafer, broadband measurements of two-port nanofiber devices were made in order to test the short-term repeatability of a widely used measurement approach that builds on established on-wafer calibration techniques. The test devices used in this study

Calibrated nanoscale capacitance measurements using a scanning microwave microscope

November 2, 2010
Author(s)
H P. Hubner, M. Moertelmaier, Pavel Kabos, M. Fenner, C Rankl, Atif A. Imtiaz
A scanning microwave microscope (SMM) for spatially resolved capacitance measurements in the attofarad-to-femtofarad regime is presented. The system is based on the combination of an atomic force microscope (AFM) and a performance network analyzer (PNA

Accurate Measurements of Process Gas Flow with Laminar Flow Meters

October 15, 2010
Author(s)
Thiago Cobu, Robert F. Berg, John D. Wright, Michael R. Moldover
We calibrated three models of commercially-manufactured, laminar flow meters (LFMs) with nitrogen at four pressures (100 kPa, 200 kPa, 300 kPa, and 400 kPa) over a 10:1 flow range using NIST’s primary flow standards and a physical model. Without additional

Bilateral Comparison Confirms NIMs and NISTs Gas Flow Capabilities

October 15, 2010
Author(s)
Aaron N. Johnson, CHUNHUI LI
The bilateral comparison between NIM and NIST for gas flow was conducted from June 2008 to October 2009. Two critical flow venturis (CFVs) with nominal throat diameters of 10 mm and 20 mm, respectively, were selected as transfer standards. The CFVs were

Properties for Accurate Gas Flow Measurements

October 15, 2010
Author(s)
John D. Wright
Accurate gas properties are needed to take full advantage of the low uncertainties provided by NIST’s Gas Flow Calibration Services. If a flowmeter user and NIST use different values for these properties (molecular mass, compressibility, density, viscosity

Multi-Frequency Approach to Vector-Network-Analyzer Scattering-Parameter Measurements

September 28, 2010
Author(s)
Arkadiusz C. Lewandowski, Dylan F. Williams, Wojciech Wiatr
We present a multi-frequency approach to vector-network-analyzer scattering-parameter measurements. This novel approach accounts for the relationships between the measurements at different frequencies, and thus breaks with the traditional paradigm to

Comparison of Microwave Black-Body Target Radiometric Measurements

July 30, 2010
Author(s)
Dave K. Walker, Dazhen Gu, Katherine MacReynolds, Randy Direen, James P. Randa, Amanda Cox, Derek A. Houtz, Robert L. Billinger
Accurate characterization of the brightness temperature (T_B) of black-body targets used for calibrating microwave remote-sensing radiometers includes many inputs: antenna pattern and loss, target temperature, target emissivity, mechanical alignment, and

Metrology of Microstructured Waveguides for Spintronic Applications

July 30, 2010
Author(s)
SangHyun S. Lim, Atif A. Imtiaz, Dazhen Gu, Pavel Kabos, Thomas Mitchell (Mitch) Wallis
Patterned permallay films as a part of a coplanar waveguide (CPW) were fabricated, and the magnetization dynamics of such structures was investigated as fundamental building blocks for magnetic spintronic devices. Anisotropic magneto-resistance (AMR)

Using Microfluidic Channels to Determine ZThe Quantitative Permittivity of Nanoliter Fluid Volumes from 50 MHz TO 40 GHz USING MICROFLUIDIC CHANNELS TO DETERMINE THE QUANTITATIVE PERMITTIVITY OF NANOLITER FLUID VOLUMES FROM 50 MHZ TO 40 GHZ

July 30, 2010
Author(s)
James C. Booth, Nathan D. Orloff, Xiaoli Lu, Yu Y. Wang, Eduard Rocas, Jordi Mateu, Juan C. Collado Gomez, Michael D. Janezic
We describe the development of coplanar waveguide measurement structures integrated with microfluidic channels in order to rapidly determine the broadband dielectric properties of nanoliter volumes of fluids, fluid mixtures, and colloids over the range of

Lights, Camera, Metrology: Introducing the Metrology Careers Outreach DVD

July 25, 2010
Author(s)
Elizabeth J. Benham
The National Conference of Standards Laboratories International (NCSLI) 164 Education Liaison and Outreach Committee has coordinated the development of a Metrology Career Multimedia DVD, titled "Find a Cool Career in Metrology." The DVD is designed for use
Was this page helpful?