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Richard S. Gates, Mark Reitsma, John A. Kramar, Jon R. Pratt
The evolution of the atomic force microscope into a useful tool for measuring mechanical properties of surfaces at the nanoscale has spurred the need for more precise and accurate methods for calibrating the spring constants of test cantilevers. Groups
The millimeter and submillimeter frequency ranges are becoming very important to todays electronics, security and communication industries. NIST has undertaken a research program to aggressively pursue this area. This paper will cover the millimeter
Pulse metrology refers to the science of the measurement of pulses, which are transient phenomena. This article describes concepts important for pulse metrology, namely, reproducibility and repeatability of measurement, measurement uncertainty, and
Lawrence T. Hudson, C M. O'Brien, Uri Feldman, Stephen M. Seltzer, Hye-Sook Park, John F. Seely
Two quartz (10-11) crystals were cylindrically bent to 25.4 cm radius of curvature and were mounted in identical Cauchois type transmission spectrometers, and the crystal diffraction efficiencies were measured to 5 % absolute accuracy using narrow
There are several core areas that are covered by the NIST microwave metrology services. These include thermal noise, power, scattering-parameters (s-parameters), field strength and antenna parameters. The rapid change in technology and the current economic
Several core areas are covered by the NIST microwave metrology services. These include thermal noise, power, scattering-parameter (s-parameters), field strength and antenna parameters. The rapid change in technology and the current economic conditions have
There are several core areas that are covered by the NIST microwave metrology services. These include thermal noise, power, scattering-parameters (s-parameters), field strength and antenna parameters. The rapid change in technology and the current economic
Piotr S. Filipski, M. Boecker, Samuel Benz, Charles J. Burroughs
National Research Council Canada (NRC) recently established an AC Josephson Voltage Standard system based on NIST pulse-driven Josephson junction arrays. This paper describes the efforts undertaken at NRC and the experience that was gained. An experimental
Joachim Fischer, M. DePodesta, K. D. Hill, Michael R. Moldover, Laurent Pitre, R. Rusby, Peter Steur, Osamu Tamura, R. White, L. Wolber
In 2005, the Consultative Committee for Thermometry (CCT) recommended the creation of a Mise en pratique for the definition of the kelvin and envisioned that future versions of the Mise en pratique would recommend values of the differences between
Nathan D. Orloff, Jordi Mateu, Arkadiusz C. Lewandowski, Eduard Rocas, Joshua P. King, Dazhen Gu, Juan C. Collado Gomez, Ichiro Takeuchi, Xiaoli Lu, James C. Booth
We present a method to obtain a broadband on wafer calibration from 45 MHz to 40 GHz for variable temperature, which requires three standards: a thru-reflect, and series-resistor. The maximum error of this technique compared to a benchmark 9 standard
Eduard Rocas, Alberto Padilla, Jordi Mateu, Juan C. Collado Gomez, James C. Booth, Juan M. O'Callaghan
This work proposes a superconducting multiplexer filter bank configuration to be used as a frequency-selective power limiter. The proposed configuration limits narrowband high power signals without degrading the signal performance in the remainder
Eduard Rocas, Juan C. Collado Gomez, Jordi Mateu, Nathan D. Orloff, James C. Booth
This work proposes a modeling method to simulate how temperature rise, due to power dissipation, affects the performance of a HTS limiter. The spatial temperature rise distribution across and along a HTS transmission line is determined by heat generation
Douglas A. Olson, Robert G. Driver, Walter J. Bowers Jr.
The National Institute of Standards and Technology has redefined its gas pressure scale, up to 17 MPa, based on two primary standard piston gauges. The primary standard piston gauges are 35.8 mm in diameter and operate from 20 kPa to 1 MPa. Ten secondary
Thomas M. Wallis, Atif A. Imtiaz, SangHyun S. Lim, Pavel Kabos, Kichul Kim, Paul Rice, Dejan Filipovic
On-wafer, broadband measurements of two-port nanofiber devices were made in order to test the short-term repeatability of a widely used measurement approach that builds on established on-wafer calibration techniques. The test devices used in this study
H P. Hubner, M. Moertelmaier, Pavel Kabos, M. Fenner, C Rankl, Atif A. Imtiaz
A scanning microwave microscope (SMM) for spatially resolved capacitance measurements in the attofarad-to-femtofarad regime is presented. The system is based on the combination of an atomic force microscope (AFM) and a performance network analyzer (PNA
Felipe Hernandez-Marquez, Randolph Elmquist, Benjamin Rodriguez
The development of measurement systems of electrical resistance based on the principle of current comparison in the late 1960s [1] has provided some of the best ways to achieve very low measurement uncertainties in the range of 1 Ω to 10 kΩ. Examples of
Thiago Cobu, Robert F. Berg, John D. Wright, Michael R. Moldover
We calibrated three models of commercially-manufactured, laminar flow meters (LFMs) with nitrogen at four pressures (100 kPa, 200 kPa, 300 kPa, and 400 kPa) over a 10:1 flow range using NISTs primary flow standards and a physical model. Without additional
The bilateral comparison between NIM and NIST for gas flow was conducted from June 2008 to October 2009. Two critical flow venturis (CFVs) with nominal throat diameters of 10 mm and 20 mm, respectively, were selected as transfer standards. The CFVs were
Aaron N. Johnson, Christopher J. Crowley, Tsyh Tyan Yeh
The National Institute of Standards and Technology (NIST) uses a bi-directional piston prover as its primary standard for measuring hydrocarbon liquid flows ranging from 1.86 × 10-5 m3/s (0.3 gpm) to 2.6 × 10-3 m3/s (40 gpm). An uncertainty analysis is
Accurate gas properties are needed to take full advantage of the low uncertainties provided by NISTs Gas Flow Calibration Services. If a flowmeter user and NIST use different values for these properties (molecular mass, compressibility, density, viscosity
Arkadiusz C. Lewandowski, Dylan F. Williams, Wojciech Wiatr
We present a multi-frequency approach to vector-network-analyzer scattering-parameter measurements. This novel approach accounts for the relationships between the measurements at different frequencies, and thus breaks with the traditional paradigm to
Dave K. Walker, Dazhen Gu, Katherine MacReynolds, Randy Direen, James P. Randa, Amanda Cox, Derek A. Houtz, Robert L. Billinger
Accurate characterization of the brightness temperature (T_B) of black-body targets used for calibrating microwave remote-sensing radiometers includes many inputs: antenna pattern and loss, target temperature, target emissivity, mechanical alignment, and
SangHyun S. Lim, Atif A. Imtiaz, Dazhen Gu, Pavel Kabos, Thomas Mitchell (Mitch) Wallis
Patterned permallay films as a part of a coplanar waveguide (CPW) were fabricated, and the magnetization dynamics of such structures was investigated as fundamental building blocks for magnetic spintronic devices. Anisotropic magneto-resistance (AMR)
James C. Booth, Nathan D. Orloff, Xiaoli Lu, Yu Y. Wang, Eduard Rocas, Jordi Mateu, Juan C. Collado Gomez, Michael D. Janezic
We describe the development of coplanar waveguide measurement structures integrated with microfluidic channels in order to rapidly determine the broadband dielectric properties of nanoliter volumes of fluids, fluid mixtures, and colloids over the range of
The National Conference of Standards Laboratories International (NCSLI) 164 Education Liaison and Outreach Committee has coordinated the development of a Metrology Career Multimedia DVD, titled "Find a Cool Career in Metrology." The DVD is designed for use