A Compact Variable-Temperature Broadband Series-Resistor Calibration

Published

January 1, 2011

Author(s)

Nathan D. Orloff, Jordi Mateu, Arkadiusz C. Lewandowski, Eduard Rocas, Joshua P. King, Dazhen Gu, Juan C. Collado Gomez, Ichiro Takeuchi, Xiaoli Lu, James C. Booth

Abstract

We present a method to obtain a broadband on wafer calibration from 45 MHz to 40 GHz for variable temperature, which requires three standards: a thru-reflect, and series-resistor. The maximum error of this technique compared to a benchmark 9 standard multiline thru-reflect-line is comparable to the repeatability of the benchmark calibration. The series-resistor standard is modeled as a lumped-element π -network. We show that the model is stable over a long times, and compare the calibration to multiline thru-reflect line as a function of time. The approach is then demonstrated at variable temperature, where the model parameters are extracted at 300 K down to 20 K to determine their temperature dependence. The resultant technique reduced the total footprint of the calibration standards by a factor of 17 and measurement time by a factor of 3.

Citation

IEEE Transactions on Microwave Theory and Techniques

Volume

59

Pub Type

Journals

Keywords

calibration, error correction, microwave, scattering parameters, series-resistor, temperature, cryogenic

Citation

Orloff, N. , Mateu, J. , Lewandowski, A. , Rocas, E. , King, J. , Gu, D. , Collado, J. , Takeuchi, I. , Lu, X. and Booth, J. (2011), A Compact Variable-Temperature Broadband Series-Resistor Calibration, IEEE Transactions on Microwave Theory and Techniques (Accessed April 26, 2024)