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Broadband Measurements of Nanofiber Devices: Repeatability and Random Error Analysis

Published

Author(s)

Thomas M. Wallis, Atif A. Imtiaz, SangHyun S. Lim, Pavel Kabos, Kichul Kim, Paul Rice, Dejan Filipovic

Abstract

On-wafer, broadband measurements of two-port nanofiber devices were made in order to test the short-term repeatability of a widely used measurement approach that builds on established on-wafer calibration techniques. The test devices used in this study consist of Pt nanowire and Au microbridge structures incorporated into two-port coplanar waveguides. Based on repeated measurements of these test structures, statistical (Type A) uncertainties were calculated. The mean and standard deviation of repeated measurements of the magnitude of the admittance matrix elements for a typical Pt nanowire device between 1 GHz and 40 GHz were determined. Throughout the measured frequency range (1 GHz to 40 GHz), the standard deviation (k = 1) is less than 50 S. The analysis suggests refinements to the measurement process depending on the desired output of the measurements, e.g. the broadband response itself or the extraction of circuit model parameters.  
Proceedings Title
76th ARFTG Microwave Measurement Symposium
Conference Dates
November 30-December 3, 2010
Conference Location
Clearwater Beach, FL

Keywords

Microwave measurements, Nanotechnology, Nanowires, On-wafer devices, Calibrations

Citation

Wallis, T. , Imtiaz, A. , Lim, S. , Kabos, P. , Kim, K. , Rice, P. and Filipovic, D. (2010), Broadband Measurements of Nanofiber Devices: Repeatability and Random Error Analysis, 76th ARFTG Microwave Measurement Symposium, Clearwater Beach, FL, [online], https://doi.org/10.1109/ARFTG76.2010.5700058 (Accessed April 21, 2024)
Created November 30, 2010, Updated November 10, 2018