Broadband Measurements of Nanofiber Devices: Repeatability and Random Error Analysis

Published

November 30, 2010

Author(s)

Thomas M. Wallis, Atif A. Imtiaz, SangHyun S. Lim, Pavel Kabos, Kichul Kim, Paul Rice, Dejan Filipovic

Abstract

On-wafer, broadband measurements of two-port nanofiber devices were made in order to test the short-term repeatability of a widely used measurement approach that builds on established on-wafer calibration techniques. The test devices used in this study consist of Pt nanowire and Au microbridge structures incorporated into two-port coplanar waveguides. Based on repeated measurements of these test structures, statistical (Type A) uncertainties were calculated. The mean and standard deviation of repeated measurements of the magnitude of the admittance matrix elements for a typical Pt nanowire device between 1 GHz and 40 GHz were determined. Throughout the measured frequency range (1 GHz to 40 GHz), the standard deviation (k = 1) is less than 50 S. The analysis suggests refinements to the measurement process depending on the desired output of the measurements, e.g. the broadband response itself or the extraction of circuit model parameters.  

Proceedings Title

76th ARFTG Microwave Measurement Symposium

Conference Dates

November 30-December 3, 2010

Conference Location

Clearwater Beach, FL

Pub Type

Conferences

Download Paper

https://doi.org/10.1109/ARFTG76.2010.5700058

Keywords

Microwave measurements, Nanotechnology, Nanowires, On-wafer devices, Calibrations

Citation

Wallis, T. , Imtiaz, A. , Lim, S. , Kabos, P. , Kim, K. , Rice, P. and Filipovic, D. (2010), Broadband Measurements of Nanofiber Devices: Repeatability and Random Error Analysis, 76th ARFTG Microwave Measurement Symposium, Clearwater Beach, FL, [online], https://doi.org/10.1109/ARFTG76.2010.5700058 (Accessed October 10, 2024)