Metrology of Microstructured Waveguides for Spintronic Applications
SangHyun S. Lim, Atif A. Imtiaz, Dazhen Gu, Pavel Kabos, Thomas Mitchell (Mitch) Wallis
Patterned permallay films as a part of a coplanar waveguide (CPW) were fabricated, and the magnetization dynamics of such structures was investigated as fundamental building blocks for magnetic spintronic devices. Anisotropic magneto-resistance (AMR) effect was utilized as the metrology tool to study the dynamic of such devices structures. The introduced approach is suitable for investigation of the magnetization dynamics in small magnetic devices.
CPEM 2010: Conference on Precision Electromagnetics Measurement 2010
, Imtiaz, A.
, Gu, D.
, Kabos, P.
and Wallis, T.
Metrology of Microstructured Waveguides for Spintronic Applications, CPEM 2010: Conference on Precision Electromagnetics Measurement 2010, Daejon, -1, KR, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=904836
(Accessed December 5, 2023)