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PUBLICATIONS

Metrology of Microstructured Waveguides for Spintronic Applications

Published

Author(s)

SangHyun S. Lim, Atif A. Imtiaz, Dazhen Gu, Pavel Kabos, Thomas Mitchell (Mitch) Wallis

Abstract

Patterned permallay films as a part of a coplanar waveguide (CPW) were fabricated, and the magnetization dynamics of such structures was investigated as fundamental building blocks for magnetic spintronic devices. Anisotropic magneto-resistance (AMR) effect was utilized as the metrology tool to study the dynamic of such devices structures. The introduced approach is suitable for investigation of the magnetization dynamics in small magnetic devices.
Proceedings Title
CPEM 2010: Conference on Precision Electromagnetics Measurement 2010
Conference Dates
June 14-18, 2010
Conference Location
Daejon, -1, KR
Pub Type
Conferences

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Keywords

magneto dynamics, magnonic crystals, vortex excitation
Magnetoelectronics, Magnetics and Calibration services

Citation

Lim, S. , Imtiaz, A. , Gu, D. , Kabos, P. and Wallis, T. (2010), Metrology of Microstructured Waveguides for Spintronic Applications, CPEM 2010: Conference on Precision Electromagnetics Measurement 2010, Daejon, -1, KR, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=904836 (Accessed October 9, 2024)

Issues

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Created July 29, 2010, Updated October 12, 2021