Ginley, R.
(2011),
NIST's High Frequency Metrology Programs: Current Capabilities and Future Directions, Metrologist: NCSLI Worldwide News
(Accessed December 12, 2024)
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NIST's High Frequency Metrology Programs: Current Capabilities and Future Directions
Published
Author(s)
Abstract
Several core areas are covered by the NIST microwave metrology services. These include thermal noise, power, scattering-parameter (s-parameters), field strength and antenna parameters. The rapid change in technology and the current economic conditions have motivated us to re-examine our microwave measurement services at NIST, discuss what changes are happening to those services, and then give a glimpse of the future directions for the programs.Citation
Metrologist: NCSLI Worldwide News
Volume
6
Pub Type
Journals
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created March 31, 2011, Updated January 27, 2020