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PUBLICATIONS

NIST's High Frequency Metrology Programs: Current Capabilities and Future Directions

Published

Author(s)

Ronald A. Ginley

Abstract

Several core areas are covered by the NIST microwave metrology services. These include thermal noise, power, scattering-parameter (s-parameters), field strength and antenna parameters. The rapid change in technology and the current economic conditions have motivated us to re-examine our microwave measurement services at NIST, discuss what changes are happening to those services, and then give a glimpse of the future directions for the programs.
Citation
Metrologist: NCSLI Worldwide News
Volume
6
Pub Type
Journals
Electromagnetics and Calibration services

Citation

Ginley, R. (2011), NIST's High Frequency Metrology Programs: Current Capabilities and Future Directions, Metrologist: NCSLI Worldwide News (Accessed October 17, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact [email protected].

Created March 31, 2011, Updated January 27, 2020
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