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When Jorge Campbell, an engineer from Argentina’s National Institute of Industrial Technology (INTI), visited the National Institute of Standards and Technology
Question: How many measurement scientists does it take to screw in an LED lightbulb? Answer: For researchers at the National Institute of Standards and
Measuring large forces, such as the thrust of a rocket engine or the deflection of an aircraft wing, requires well-calibrated force sensors. NIST’s unique
The Dimensional Measurement Services (DMS) project delivers unique high-accuracy length based calibrations that are essential to global trade, supports basic
Measurements of radium isotopes in the naturally-occurring radioactive decay chains (i.e., 235U, 238U, and 232Th) are exceedingly important for various
The Advanced Dimensional Measurement Systems (ADMS) project provides the measurement science and infrastructure needed by industry to adopt new dimensional
Dianne L. Poster, C Cameron Miller, Yaw S. Obeng, John J. Kasianowicz, Michael T. Postek, Norman Horn, Troy Cowan, Richard Martinello
The development of an international, precompetitive, collaborative, ultraviolet (UV) research consortium is discussed as an opportunity to lay the groundwork
This report details the results of the Inter-American Metrology System (SIM) key comparison on regular spectral transmittance (SIM.PR-K6.2010). Eight national
Dianne L. Poster, C Cameron Miller, Richard Martinello, Norman Horn, Michael T. Postek, Troy Cowan, Yaw S. Obeng, John J. Kasianowicz
The National Institute of Standards and Technology (NIST) hosted an international workshop on ultraviolet-C (UV-C) disinfection technologies on January 14 – 15
John D. Wright, Gina Kline, Kevin John, Brian Novitsky, Jason Bellavance, Kevin SHufelt, Bradley Nease, Miles Owen, Joseph Allen, Casey Rombouts, William Gause, John Cuccio
A comparison of seven gas flow calibration laboratories piloted by NIST used four laminar flow meters as the transfer standards for nine nitrogen gas flows
Aluminum oxide (Al2O3) photodiodes are issued by NIST as transfer standard detectors in the extreme ultraviolet spectral region (5 nm to 125 nm). Each device is
Visible to near-infrared spectral comparator facility (Vis/NIR SCF) The Vis/NIR SCF is a monochromator-based system that typically measures the spectral power
The NIST Physical Measurement Laboratory has established the color and appearance metrology facility to support calibration services for 0°/45° colored samples
Silicon (Si) photodiodes are issued by NIST as transfer standard detectors throughout the extreme ultraviolet spectral region (5 nm to 254 nm). Each device is