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NIST's High Frequency Metrology Program: Current Capabilities and Future Directions

Published

Author(s)

Ronald A. Ginley

Abstract

There are several core areas that are covered by the NIST microwave metrology services. These include thermal noise, power, scattering-parameters (s-parameters), field strength and antenna parameters. The rapid change in technology and the current economic conditions have made us re-examine our services and to make changes where necessary. In this paper we will examine the current state of the microwave measurement services at NIST, discuss what changes are happening to those services and then give a glimpse at the future directions for the programs.
Citation
Metrologist: NCSLI Worldwide News
Volume
6

Citation

Ginley, R. (2011), NIST's High Frequency Metrology Program: Current Capabilities and Future Directions, Metrologist: NCSLI Worldwide News (Accessed July 13, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created March 31, 2011, Updated January 27, 2020