Ginley, R.
(2011),
NIST's High Frequency Metrology Program: Current Capabilities and Future Directions, Metrologist: NCSLI Worldwide News
(Accessed March 25, 2025)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
NIST's High Frequency Metrology Program: Current Capabilities and Future Directions
Published
Author(s)
Abstract
There are several core areas that are covered by the NIST microwave metrology services. These include thermal noise, power, scattering-parameters (s-parameters), field strength and antenna parameters. The rapid change in technology and the current economic conditions have made us re-examine our services and to make changes where necessary. In this paper we will examine the current state of the microwave measurement services at NIST, discuss what changes are happening to those services and then give a glimpse at the future directions for the programs.Citation
Metrologist: NCSLI Worldwide News
Volume
6
Pub Type
Journals
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created March 31, 2011, Updated January 27, 2020