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Nanotechnology

Nanometrology

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Displaying 226 - 250 of 866

Giant surface conductivity enhancement in a carbon nanotube composite by ultraviolet light exposure

July 28, 2016
Author(s)
Christian Long, Nathan Orloff, Kevin A. Twedt, Thomas F. Lam, Luis F. Vargas Lara, Minhua Zhao, Bharath N. Natarajan, Keana C. K. Scott, Eric Marksz, Tinh Nguyen, Jack Douglas, Jabez McClelland, Edward Garboczi, Jan Obrzut, James Liddle
Carbon nanotube composites are lightweight, multifunctional materials with readily adjustable mechanical and electrical properties—relevant to the aerospace, automotive, and sporting goods industries as high-performance building materials. Here, we combine

Introducing a New NIST Reference Material: Multiwall Carbon Nanotube Soot

July 25, 2016
Author(s)
Ann C. Chiaramonti Debay, Ryan M. White, Jason D. Holm, Elisabeth Mansfield
Multi-walled carbon nanotubes (MWCNTs) play a significant role in the nascent nanotechnology industry, due to their remarkable combination of mechanical, thermal, and electrical properties. These materials are specialty additives, reinforcing a diverse

Versatile fluidic cell for in-situ electrochemical measurements in SEM

July 24, 2016
Author(s)
Jeyavel Velmurugan, Ana Stevanovic, Feng Yi, David A. LaVan, Andrei Kolmakov
Electrochemical techniques such as like electrodeposition are crucially important for fabrication of nanostructured materials. The details of cluster nucleation and growth at early stages of electrodeposition are extremely important for morphology and

Multiscale Metrologies for Process Optimization of Carbon Nanotube Polymer Composites

July 18, 2016
Author(s)
Bharath N. Natarajan, Nate Orloff, Rana N. Ashkar, Sagar Doshi, Kevin A. Twedt, Ajay Krishnamurthy, Chelsea S. Davis, Aaron M. Forster, Erik Thostenson, Jan Obrzut, Renu Sharma, James Alexander Liddle
Carbon nanotube (CNT) polymer composites are materials with attractive multifunctional properties that are becoming used in a growing range of commercial applications. With the increasing demand for these materials, it is imperative to develop methods for

Phonon Anharmonicity in Bulk Td-MoTe2

July 18, 2016
Author(s)
Albert Davydov, Sergiy Krylyuk, Irina Kalish, Ryan Beams, Patrick Vora
We examine anharmonic contributions to the optical phonon frequency in bulk Td-MoTe2 phase through temperature-dependent Raman spectroscopy. At temperatures greater than 100 K we find that the optical phonon modes redshift linearly with temperature in

Local coexistence of VO2 phases revealed by deep data analysis

July 7, 2016
Author(s)
Evgheni Strelcov, Anton Ievlev, Alex Belianinov, Alexander Tselev, Andrei A. Kolmakov, Sergei Kalinin
We report a synergistic approach of micro-Raman spectroscopic mapping and deep data analysis to study the distribution of crystallographic phases and ferroelastic domains in a defected Al-doped VO2 microcrystal. Bayesian linear unmixing revealed an uneven

Transient thermometry and high-resolution analysis of filamentary resistive switches

June 28, 2016
Author(s)
Jonghan Kwon, Chao-Yang Chen, Abhishek Sharma, Andrea Fantini, Malgorzata Jurczak, James A. Bain, Yoosuf Picard, Marek Skowronski, Andrew Herzing
We present data on the filament size and temperature distribution in Hf0.82Al0.18Ox-based Resistive Random Access Memory (RRAM) devices obtained by transient thermometry and high- resolution transmission electron microscopy (HRTEM). The thermometry shows

Atomic structural evolution during the reduction of a-Fe2O3 nanowires

June 20, 2016
Author(s)
Wenhui Zhu, Jonathan P. Winterstein, Itai Maimon, Qiyue Yin, Lu Yuan, Aleksey N. Kolmogorov, Renu Sharma, Guangwen Zhou
The atomic-scale reduction mechanism of α-Fe2O3 nanowires by H2 was followed using transmission electron microscopy to reveal the evolution of atomic structures and the associated transformation pathways for different iron oxides. The reduction commences

Near-field microwave microscopy of one-dimensional nanostructures

May 23, 2016
Author(s)
Samuel Berweger, Paul T. Blanchard, Rebecca C. Quardokus, Frank W. DelRio, Thomas Mitchell (Mitch) Wallis, Pavel Kabos, Sergiy Krylyuk, Albert Davydov
With the ability to measure sample conductivity with nanometer spatial resolution, scanning microwave microscopy (SMM) is a powerful tool to study nanoscale electronic systems and devices. Here we demonstrate the general capability to image electronic

Characterization of Buried Interfaces with Scanning Probe Microscopes

May 19, 2016
Author(s)
Joseph J. Kopanski, Lin You, Jungjoon Ahn, Yaw S. Obeng
Scanning probe microscopes (SPMs) have some capability to image sub-surface structure, including the details of buried interfaces. This paper describes the theoretical and practical basis for obtaining information about shallow buried interfaces

Use of the Bethe Equation for Inner-Shell Ionization by Electron Impact

May 13, 2016
Author(s)
Cedric J. Powell, Xavier Llovet, Francesc Salvat
We analyzed calculated cross sections for K-, L-, and M-shell ionization by electron impact to determine the energy ranges over which these cross sections are consistent with the Bethe equation for inner-shell ionization. Our analysis was performed with K
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