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Nanotechnology

Nanometrology

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Displaying 251 - 275 of 855

Bright focused ion beam sources based on laser-cooled atoms

March 24, 2016
Author(s)
Jabez J. McClelland, Adam V. Steele, Brenton J. Knuffman, Kevin A. Twedt, Andrew D. Schwarzkopf, Truman M. Wilson
Nanoscale focused ion beams (FIBs) represent one of the most useful tools in nanotechnology, enabling nanofabrication via milling and gas-assisted deposition, microscopy and microanalysis, and selective, spatially resolved doping of materials. Recently, a

Virtual rough samples to test 3D nanometer-scale SEM stereo photogrammetry

March 22, 2016
Author(s)
John S. Villarrubia, Vipin N. Tondare, Andras Vladar
The combination of SEM for high spatial resolution, images from multiple angles to provide 3D information, and commercially available stereo photogrammetry software for 3D reconstruction offers promise for dimensional metrology in 3D. A method is described

Behavior of molecules and molecular ions near a field emitter

March 18, 2016
Author(s)
Ann C. Chiaramonti Debay, Baptiste Gault, Michael Ashton, Susan B. Sinnott, Michael P. Moody, David W. Saxey, D. K. Schreiber
The cold emission of particles from surfaces under intense electric fields is a process which underpins a variety of applications including atom probe tomography (APT), an analytical microscopy technique with near-atomic spatial resolution. Increasingly

Centroid and Orientation Precision of Localization Microscopy

March 11, 2016
Author(s)
Craig D. McGray, Craig R. Copeland, Samuel M. Stavis, Jon C. Geist
The concept of localization precision, which is essential to localization microscopy, is formally extended from optical point sources to microscopic rigid bodies. Measurement functions are presented to calculate the planar position, orientation, and motion

Optical Tracking of Nanoscale Particles in Microscale Environments

March 10, 2016
Author(s)
Pramod Mathai, James A. Liddle, Samuel M. Stavis
The trajectories of nanoscale particles through microscale environments record useful information about both the particles and the environments. Optical microscopes provide efficient access to this information through measurements of light in the far field

Process Optimization for Lattice-Selective Wet Etching of Crystalline Silicon Structures

March 9, 2016
Author(s)
Ronald G. Dixson, William F. Guthrie, Richard A. Allen, Ndubuisi G. Orji, Michael W. Cresswell, Christine E. Murabito
Lattice-selective etching of silicon is used in a number of applications, but it is particularly valuable in those for which the lattice-defined sidewall angle can be beneficial to the functional goals. A relatively small but important niche application is

Spontaneous growth of GaN nanowire nuclei on N- and Al-polar AlN: A piezoresponse force microscopy study of crystallographic polarity

March 2, 2016
Author(s)
Matthew D. Brubaker, Alexana Roshko, Paul T. Blanchard, Todd E. Harvey, Norman A. Sanford, Kristine A. Bertness
The polarity of gallium nitride (GaN) nanowire nuclei grown on AlN layers was studied by piezoresponse force microscopy (PFM). N- or Al-polar AlN layers were grown by molecular beam epitaxy (MBE) on Si (111) substrates by use of Al- or N-rich growth

Multifocus microscopy with precise color multi-phase diffractive optics applied in functional neuronal imaging

March 1, 2016
Author(s)
Sara Abrahamsson, Robert Ilic, Jan Wisniewski, Brian Mehl, Liya Yu, Lei Chen, Marcelo I. Davanco, Laura Oudjedi, Jean Bernard Fiche, Bassam Hajj, Xin Jin, Joan Pulupa, Christine Cho, Mustafa Mir, Mohamed El Beheiry, Xavier Darzacq, Marcelo Nollmann, Maxime Dahan, Carl Wu, Timothee Lionnett, James Alexander Liddle, Cornelia Bargmann
Multifocus microscopy (MFM) allows high-resolution instantaneous three-dimensional (3D) imaging and has been applied to study biological specimens ranging from single molecules inside cell nuclei to entire embryos. In any live microscopy application

Through-the-Glass Spectroscopic Ellipsometry for Analysis of CdTe Thin-Film Solar Cells in the Superstrate Configuration

February 25, 2016
Author(s)
Prakash Koirala, Jian Li, Heayoung Yoon, Puruswottam Aryal, Sylvain Marsillac, Angus R. Rockett, Nikolas Podraza, Robert W. Collins
Polycrystalline CdS/CdTe thin-film solar cells in the superstrate configuration have been studied by spectroscopic ellipsometry (SE) using glass side illumination. In this measurement method, the first reflection from the ambient/glass interface is

Near-field control and imaging of free charge carrier variations in GaN nanowires

February 15, 2016
Author(s)
Samuel Berweger, Paul T. Blanchard, Matthew Brubaker, Kevin J. Coakley, Norman A. Sanford, Thomas Mitchell (Mitch) Wallis, Kris A. Bertness, Pavel Kabos
Despite their uniform crystallinity, the shape and faceting of semiconducting nanowires (NWs) can give rise to variations in structure and associated electronic properties. Here we investigate local variations in electronic structure across individual n

Steady State Vapor Bubble in Pool Boiling

February 3, 2016
Author(s)
An Zou, Ashish Chanana, Amit Agrawal, Peter C. Wayner, Jr., Shalabh C. Maroo
Boiling, a dynamic and multiscale process, has been studied for over five decades; however, a comprehensive understanding of the process is still lacking. The bubble ebullition cycle, which involves nucleation, growth and departure, happens over a very

Recent approaches for bridging the pressure gap in photoelectron microspectroscopy

January 29, 2016
Author(s)
Andrei A. Kolmakov, Luca Gregoratti, Maya Kiskinova, Sebastian Gunther
Ambient pressure photoelectron spectroscopy (APPES) and microscopy are at the frontier of modern chemical analysis at liquid-gas, solid-liquid and solid-gas interfaces, bridging science and engineering of functional materials. Complementing the current

Lateral Tip Control Effects in CD-AFM Metrology: The Large Tip Limit

January 25, 2016
Author(s)
Ronald G. Dixson, Ndubuisi G. Orji, Ryan Goldband
Sidewall sensing in CD-AFMs usually involves continuous lateral dithering of the tip or the use of a control algorithm and fast response piezo actuator to position the tip in a manner that resembles touch-triggering of coordinate measuring machine (CMM)

Imaging Nanophotonic Modes of Microresonators using a Focused Ion Beam

January 15, 2016
Author(s)
Kevin A. Twedt, Jie J. Zou, Marcelo I. Davanco, Kartik A. Srinivasan, Jabez J. McClelland, Vladimir A. Aksyuk
Optical microresonators have proven powerful in a wide range of applications, including cavity quantum electrodynamics, biosensing, microfludics, and cavity optomechanics. Their performance depends critically on the exact distribution of optical energy

Scanning tunneling spectroscopy of proximity superconductivity in epitaxial multilayer graphene

January 7, 2016
Author(s)
Donat F. Natterer, Jeonghoon Ha, Hongwoo H. Baek, Duming Zhang, William G. Cullen, Nikolai B. Zhitenev, Young Kuk, Joseph A. Stroscio
Superconducting aluminum films were grown on multilayer graphene. The aluminum films were discontinuous with networks of trenches in the film morphology reaching down to the substrate to exposed graphene terraces. Superconductivity was induced in

Growth of one-dimensional nanomaterials in the ETEM

January 1, 2016
Author(s)
Jonathan P. Winterstein, Renu Sharma
One-dimensional nanomaterials (nanowires and nanotubes) have a number of unique and interesting properties that have made them the subject of significant research for a wide range of applications. Electron microscopy is generally necessary for their

MEMS Nanopositioners

January 1, 2016
Author(s)
Jason J. Gorman
This book chapter provides a review of the state of the art for MEMS nanopositioners. The motivation for MEMS nanopositioners is presented with respect to the advantages of this technology compared to macroscale mechanisms and the novel applications that

Tip characterization method using multi-feature characterizer for CD-AFM

December 23, 2015
Author(s)
Ndubuisi G. Orji, Hiroshi Itoh, Chumei Wang, Ronald G. Dixson, Sebastian Schmidt, Bernd Irmer, Peter S. Walecki
In atomic force microscopy (AFM) metrology, the tip is a key source of uncertainty. Images taken with an AFM show a change in feature width and shape that depends on tip geometry. This geometric distortion is more pronounced when measuring features with

Polarity-Controlled GaN/AlN Nucleation Layers for Selective-Area Growth of GaN Nanowire Arrays on Si(111) Substrates by Molecular Beam Epitaxy

December 18, 2015
Author(s)
Matthew D. Brubaker, Shannon M. Duff, Todd E. Harvey, Paul T. Blanchard, Alexana Roshko, Aric W. Sanders, Norman A. Sanford, Kristine A. Bertness
We have demonstrated dramatic improvement in the quality of selective-area GaN nanowire growth by controlling the polarity of the underlying nucleation layers. In particular, we find that N- polarity is beneficial for the growth of large ordered nanowire
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