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Nanotechnology

Nanometrology

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Displaying 251 - 275 of 866

Optical Fluorescence Microscopy for Spatially Characterizing Electron Transfer across a Solid-Liquid Interface on Heterogeneous Electrodes

April 28, 2016
Author(s)
Eric A. Choudhary, Jeyavel Velmurugan, James M. Marr, James A. Liddle, Veronika A. Szalai
Heterogeneous catalytic materials and electrodes are used for (electro)chemical transformations, including those important for energy storage and utilization. Due to the heterogeneous nature of these materials, activity measurements with sufficient spatial

A trade-off between the mechanical strength and microwave electrical properties of functionalized and irradiated carbon nanotube sheets

April 4, 2016
Author(s)
Tiffany S. Williams, Nate Orloff, James S. Baker, Sandi G. Miller, Bharath N. Natarajan, Jan Obrzut, Linda S. McCorkle, Marisabel Lebron-Colon, James Gaier, Michael A. Meador, James Alexander Liddle
Carbon nanotube sheets are novel implementation of carbon nanotubes that enable the tailoring of electrical and mechanical properties for applications in the automotive and aerospace industries. Small molecule functionalization and/or post-processing

Enabling Quantitative Optical Imaging for In-die-capable Critical Dimension Targets

April 4, 2016
Author(s)
Bryan M. Barnes, Mark Alexander Henn, Martin Y. Sohn, Hui Zhou, Richard M. Silver
Dimensional scaling trends will eventually bring the semiconductor critical dimensions (CDs) down to only a few atoms in width. New optical techniques are required to address intra-die variability for these CDs using sufficiently small in-die metrology

Silicon epitaxy on H-terminated Si (100) surfaces at 250deg C

March 31, 2016
Author(s)
Xiao Deng, Pradeep N. Namboodiri, Kai Li, Xiqiao Wang, Gheorghe Stan, Alline F. Myers, Xinbin Cheng, Tongbao Li, Richard M. Silver
Silicon on silicon growth at low temperatures has become increasing important due to its use to encapsulate buried nanoscale dopant devices. The performance of atomic scale devices is fundamentally affected by the quality of the silicon matrix in which the

Bright focused ion beam sources based on laser-cooled atoms

March 24, 2016
Author(s)
Jabez J. McClelland, Adam V. Steele, Brenton J. Knuffman, Kevin A. Twedt, Andrew D. Schwarzkopf, Truman M. Wilson
Nanoscale focused ion beams (FIBs) represent one of the most useful tools in nanotechnology, enabling nanofabrication via milling and gas-assisted deposition, microscopy and microanalysis, and selective, spatially resolved doping of materials. Recently, a

Virtual rough samples to test 3D nanometer-scale SEM stereo photogrammetry

March 22, 2016
Author(s)
John S. Villarrubia, Vipin N. Tondare, Andras Vladar
The combination of SEM for high spatial resolution, images from multiple angles to provide 3D information, and commercially available stereo photogrammetry software for 3D reconstruction offers promise for dimensional metrology in 3D. A method is described

Behavior of molecules and molecular ions near a field emitter

March 18, 2016
Author(s)
Ann C. Chiaramonti Debay, Baptiste Gault, Michael Ashton, Susan B. Sinnott, Michael P. Moody, David W. Saxey, D. K. Schreiber
The cold emission of particles from surfaces under intense electric fields is a process which underpins a variety of applications including atom probe tomography (APT), an analytical microscopy technique with near-atomic spatial resolution. Increasingly

Centroid and Orientation Precision of Localization Microscopy

March 11, 2016
Author(s)
Craig D. McGray, Craig R. Copeland, Samuel M. Stavis, Jon C. Geist
The concept of localization precision, which is essential to localization microscopy, is formally extended from optical point sources to microscopic rigid bodies. Measurement functions are presented to calculate the planar position, orientation, and motion

Optical Tracking of Nanoscale Particles in Microscale Environments

March 10, 2016
Author(s)
Pramod Mathai, James A. Liddle, Samuel M. Stavis
The trajectories of nanoscale particles through microscale environments record useful information about both the particles and the environments. Optical microscopes provide efficient access to this information through measurements of light in the far field

Process Optimization for Lattice-Selective Wet Etching of Crystalline Silicon Structures

March 9, 2016
Author(s)
Ronald G. Dixson, William F. Guthrie, Richard A. Allen, Ndubuisi G. Orji, Michael W. Cresswell, Christine E. Murabito
Lattice-selective etching of silicon is used in a number of applications, but it is particularly valuable in those for which the lattice-defined sidewall angle can be beneficial to the functional goals. A relatively small but important niche application is

Spontaneous growth of GaN nanowire nuclei on N- and Al-polar AlN: A piezoresponse force microscopy study of crystallographic polarity

March 2, 2016
Author(s)
Matthew D. Brubaker, Alexana Roshko, Paul T. Blanchard, Todd E. Harvey, Norman A. Sanford, Kristine A. Bertness
The polarity of gallium nitride (GaN) nanowire nuclei grown on AlN layers was studied by piezoresponse force microscopy (PFM). N- or Al-polar AlN layers were grown by molecular beam epitaxy (MBE) on Si (111) substrates by use of Al- or N-rich growth

Multifocus microscopy with precise color multi-phase diffractive optics applied in functional neuronal imaging

March 1, 2016
Author(s)
Sara Abrahamsson, Robert Ilic, Jan Wisniewski, Brian Mehl, Liya Yu, Lei Chen, Marcelo I. Davanco, Laura Oudjedi, Jean Bernard Fiche, Bassam Hajj, Xin Jin, Joan Pulupa, Christine Cho, Mustafa Mir, Mohamed El Beheiry, Xavier Darzacq, Marcelo Nollmann, Maxime Dahan, Carl Wu, Timothee Lionnett, James Alexander Liddle, Cornelia Bargmann
Multifocus microscopy (MFM) allows high-resolution instantaneous three-dimensional (3D) imaging and has been applied to study biological specimens ranging from single molecules inside cell nuclei to entire embryos. In any live microscopy application

Through-the-Glass Spectroscopic Ellipsometry for Analysis of CdTe Thin-Film Solar Cells in the Superstrate Configuration

February 25, 2016
Author(s)
Prakash Koirala, Jian Li, Heayoung Yoon, Puruswottam Aryal, Sylvain Marsillac, Angus R. Rockett, Nikolas Podraza, Robert W. Collins
Polycrystalline CdS/CdTe thin-film solar cells in the superstrate configuration have been studied by spectroscopic ellipsometry (SE) using glass side illumination. In this measurement method, the first reflection from the ambient/glass interface is

Near-field control and imaging of free charge carrier variations in GaN nanowires

February 15, 2016
Author(s)
Samuel Berweger, Paul T. Blanchard, Matthew Brubaker, Kevin J. Coakley, Norman A. Sanford, Thomas Mitchell (Mitch) Wallis, Kris A. Bertness, Pavel Kabos
Despite their uniform crystallinity, the shape and faceting of semiconducting nanowires (NWs) can give rise to variations in structure and associated electronic properties. Here we investigate local variations in electronic structure across individual n
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