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Nanotechnology

Nanometrology

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Displaying 276 - 300 of 857

Tip characterization method using multi-feature characterizer for CD-AFM

December 23, 2015
Author(s)
Ndubuisi G. Orji, Hiroshi Itoh, Chumei Wang, Ronald G. Dixson, Sebastian Schmidt, Bernd Irmer, Peter S. Walecki
In atomic force microscopy (AFM) metrology, the tip is a key source of uncertainty. Images taken with an AFM show a change in feature width and shape that depends on tip geometry. This geometric distortion is more pronounced when measuring features with

Polarity-Controlled GaN/AlN Nucleation Layers for Selective-Area Growth of GaN Nanowire Arrays on Si(111) Substrates by Molecular Beam Epitaxy

December 18, 2015
Author(s)
Matthew D. Brubaker, Shannon M. Duff, Todd E. Harvey, Paul T. Blanchard, Alexana Roshko, Aric W. Sanders, Norman A. Sanford, Kristine A. Bertness
We have demonstrated dramatic improvement in the quality of selective-area GaN nanowire growth by controlling the polarity of the underlying nucleation layers. In particular, we find that N- polarity is beneficial for the growth of large ordered nanowire

Local photocarrier dynamics in CdTe solar cells under optical and electron beam excitations

December 16, 2015
Author(s)
Heayoung Yoon, Paul M. Haney, Yohan Yoon, Sang M. An, James I. Basham, Nikolai Zhitenev
We investigate local carrier dynamics in n-CdS / p-CdTe solar cells, where the electron-hole pairs are generated by either near-field optical illumination or highly focused electron beam excitation. A focused ion milling process was used to prepare a

High-Resolution Imaging and Spectroscopy at High Pressure: A Novel Liquid Cell for the Transmission Electron Microscope

December 9, 2015
Author(s)
Mihaela M. Tanase, Jonathan P. Winterstein, Renu Sharma, Vladimir A. Aksyuk, Glenn E. Holland, James A. Liddle
We demonstrate quantitative core-loss electron energy-loss spectroscopy of iron oxide nanoparticles and imaging resolution of Ag nanoparticles in liquid down to 0.24 nm, in both transmission and scanning-transmission modes, in a novel, monolithic liquid

Nanocatalyst shape and composition during nucleation of single-walled carbon nanotubes

December 7, 2015
Author(s)
Jose Gomez-Ballesteros, Juan Burgos, Pin A. Lin, Renu Sharma, Perla Balbuena
The dynamic evolution of nanocatalyst particle shape and carbon composition is examined through the initial stages of the single walled-carbon nanotubes chemical vapor deposition synthesis via classical reactive and ab initio molecular dynamics simulations

Optimizing Hybrid Metrology: Rigorous Implementation of Bayesian and Combined Regression.

November 12, 2015
Author(s)
Mark Alexander Henn, Richard M. Silver, John S. Villarrubia, Nien F. Zhang, Hui Zhou, Bryan M. Barnes, Andras Vladar, Bin Ming
Hybrid metrology, e.g. the combination of several measurement techniques to determine critical dimensions, is an important approach to meet the needs of semiconductor industry. A proper use of hybrid metrology may not only yield more reliable estimates for

Deep-subwavelength Nanometric Image Reconstruction using Fourier Domain Optical Normalization

November 5, 2015
Author(s)
Jing Qin, Richard M. Silver, Bryan M. Barnes, Hui Zhou, Ronald G. Dixson, Mark Alexander Henn
Quantitative optical measurements of deep sub-wavelength, three-dimensional, nanometric structures with sensitivity to sub-nanometer details address an ubiquitous measurement challenge. A Fourier domain normalization approach is used in the Fourier optical

Detecting Carbon in Carbon: Application of Differential Charging to Obtain Information on the Chemical Identity and Spatial Location of Carbon Nanotube Aggregates in Composites by Imaging X-ray Photoelectron Spectroscopy

October 24, 2015
Author(s)
Justin M. Gorham, William A. Osborn, Jeremiah W. Woodcock, Keana C. Scott, John M. Heddleston, Angela R. Hight Walker, Jeffrey W. Gilman
The surface contributions and dispersion properties of multiwalled carbon nanotubes (MWCNT) within a composite are important measurements to perform on nano-enabled products in order to help answer environmental health and safety questions associated with

Lateral Tip Control Effects in CD-AFM Metrology: The Large Tip Limit

October 21, 2015
Author(s)
Ronald G. Dixson, Ryan Goldband, Ndubuisi G. Orji
Critical dimension atomic force microscopes (CD-AFMs) use flared tips and two-dimensional sensing and control of the tip-sample interaction to enable scanning of features with near-vertical or even reentrant sidewalls. Features of this sort are commonly

Electronic Enhancement of the Exciton Coherence Time in Charged Quantum Dots

October 19, 2015
Author(s)
Galan A. Moody, Corey A. McDonald, Ari D. Feldman, Todd E. Harvey, Richard P. Mirin, Kevin L. Silverman
Minimizing decoherence due to coupling of a quantum system to its fluctuating environment is at the forefront of quantum information and photonics research. Nature sets the ultimate limit, however, given by the strength of the system’s coupling to the

Research highlights: Probing adsorbed organic coatings on nanoparticle surfaces

October 1, 2015
Author(s)
Stacey M. Louie, John M. Pettibone
Organic coatings adsorbed at a nanoparticle surface, together with the system properties, change the physicochemical properties of the nanoparticle, thereby possibly modifying its behavior and interactions with its surroundings. A detailed understanding of
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