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Nanotechnology

Nanometrology

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Displaying 276 - 300 of 866

Steady State Vapor Bubble in Pool Boiling

February 3, 2016
Author(s)
An Zou, Ashish Chanana, Amit Agrawal, Peter C. Wayner, Jr., Shalabh C. Maroo
Boiling, a dynamic and multiscale process, has been studied for over five decades; however, a comprehensive understanding of the process is still lacking. The bubble ebullition cycle, which involves nucleation, growth and departure, happens over a very

Recent approaches for bridging the pressure gap in photoelectron microspectroscopy

January 29, 2016
Author(s)
Andrei A. Kolmakov, Luca Gregoratti, Maya Kiskinova, Sebastian Gunther
Ambient pressure photoelectron spectroscopy (APPES) and microscopy are at the frontier of modern chemical analysis at liquid-gas, solid-liquid and solid-gas interfaces, bridging science and engineering of functional materials. Complementing the current

Lateral Tip Control Effects in CD-AFM Metrology: The Large Tip Limit

January 25, 2016
Author(s)
Ronald G. Dixson, Ndubuisi Orji, Ryan Goldband
Sidewall sensing in CD-AFMs usually involves continuous lateral dithering of the tip or the use of a control algorithm and fast response piezo actuator to position the tip in a manner that resembles touch-triggering of coordinate measuring machine (CMM)

Imaging Nanophotonic Modes of Microresonators using a Focused Ion Beam

January 15, 2016
Author(s)
Kevin A. Twedt, Jie J. Zou, Marcelo I. Davanco, Kartik A. Srinivasan, Jabez J. McClelland, Vladimir A. Aksyuk
Optical microresonators have proven powerful in a wide range of applications, including cavity quantum electrodynamics, biosensing, microfludics, and cavity optomechanics. Their performance depends critically on the exact distribution of optical energy

Scanning tunneling spectroscopy of proximity superconductivity in epitaxial multilayer graphene

January 7, 2016
Author(s)
Donat F. Natterer, Jeonghoon Ha, Hongwoo H. Baek, Duming Zhang, William G. Cullen, Nikolai B. Zhitenev, Young Kuk, Joseph A. Stroscio
Superconducting aluminum films were grown on multilayer graphene. The aluminum films were discontinuous with networks of trenches in the film morphology reaching down to the substrate to exposed graphene terraces. Superconductivity was induced in

Growth of one-dimensional nanomaterials in the ETEM

January 1, 2016
Author(s)
Jonathan P. Winterstein, Renu Sharma
One-dimensional nanomaterials (nanowires and nanotubes) have a number of unique and interesting properties that have made them the subject of significant research for a wide range of applications. Electron microscopy is generally necessary for their

MEMS Nanopositioners

January 1, 2016
Author(s)
Jason J. Gorman
This book chapter provides a review of the state of the art for MEMS nanopositioners. The motivation for MEMS nanopositioners is presented with respect to the advantages of this technology compared to macroscale mechanisms and the novel applications that

Tip characterization method using multi-feature characterizer for CD-AFM

December 23, 2015
Author(s)
Ndubuisi Orji, Hiroshi Itoh, Chumei Wang, Ronald G. Dixson, Sebastian Schmidt, Bernd Irmer, Peter S. Walecki
In atomic force microscopy (AFM) metrology, the tip is a key source of uncertainty. Images taken with an AFM show a change in feature width and shape that depends on tip geometry. This geometric distortion is more pronounced when measuring features with

Polarity-Controlled GaN/AlN Nucleation Layers for Selective-Area Growth of GaN Nanowire Arrays on Si(111) Substrates by Molecular Beam Epitaxy

December 18, 2015
Author(s)
Matthew D. Brubaker, Shannon M. Duff, Todd E. Harvey, Paul T. Blanchard, Alexana Roshko, Aric W. Sanders, Norman A. Sanford, Kristine A. Bertness
We have demonstrated dramatic improvement in the quality of selective-area GaN nanowire growth by controlling the polarity of the underlying nucleation layers. In particular, we find that N- polarity is beneficial for the growth of large ordered nanowire

Local photocarrier dynamics in CdTe solar cells under optical and electron beam excitations

December 16, 2015
Author(s)
Heayoung Yoon, Paul M. Haney, Yohan Yoon, Sang M. An, James I. Basham, Nikolai Zhitenev
We investigate local carrier dynamics in n-CdS / p-CdTe solar cells, where the electron-hole pairs are generated by either near-field optical illumination or highly focused electron beam excitation. A focused ion milling process was used to prepare a

High-Resolution Imaging and Spectroscopy at High Pressure: A Novel Liquid Cell for the Transmission Electron Microscope

December 9, 2015
Author(s)
Mihaela M. Tanase, Jonathan P. Winterstein, Renu Sharma, Vladimir A. Aksyuk, Glenn E. Holland, James A. Liddle
We demonstrate quantitative core-loss electron energy-loss spectroscopy of iron oxide nanoparticles and imaging resolution of Ag nanoparticles in liquid down to 0.24 nm, in both transmission and scanning-transmission modes, in a novel, monolithic liquid

Nanocatalyst shape and composition during nucleation of single-walled carbon nanotubes

December 7, 2015
Author(s)
Jose Gomez-Ballesteros, Juan Burgos, Pin A. Lin, Renu Sharma, Perla Balbuena
The dynamic evolution of nanocatalyst particle shape and carbon composition is examined through the initial stages of the single walled-carbon nanotubes chemical vapor deposition synthesis via classical reactive and ab initio molecular dynamics simulations

Optimizing Hybrid Metrology: Rigorous Implementation of Bayesian and Combined Regression.

November 12, 2015
Author(s)
Mark Alexander Henn, Richard M. Silver, John S. Villarrubia, Nien F. Zhang, Hui Zhou, Bryan M. Barnes, Andras Vladar, Bin Ming
Hybrid metrology, e.g. the combination of several measurement techniques to determine critical dimensions, is an important approach to meet the needs of semiconductor industry. A proper use of hybrid metrology may not only yield more reliable estimates for

Deep-subwavelength Nanometric Image Reconstruction using Fourier Domain Optical Normalization

November 5, 2015
Author(s)
Jing Qin, Richard M. Silver, Bryan M. Barnes, Hui Zhou, Ronald G. Dixson, Mark Alexander Henn
Quantitative optical measurements of deep sub-wavelength, three-dimensional, nanometric structures with sensitivity to sub-nanometer details address an ubiquitous measurement challenge. A Fourier domain normalization approach is used in the Fourier optical

Detecting Carbon in Carbon: Application of Differential Charging to Obtain Information on the Chemical Identity and Spatial Location of Carbon Nanotube Aggregates in Composites by Imaging X-ray Photoelectron Spectroscopy

October 24, 2015
Author(s)
Justin M. Gorham, William A. Osborn, Jeremiah W. Woodcock, Keana C. Scott, John M. Heddleston, Angela R. Hight Walker, Jeffrey W. Gilman
The surface contributions and dispersion properties of multiwalled carbon nanotubes (MWCNT) within a composite are important measurements to perform on nano-enabled products in order to help answer environmental health and safety questions associated with
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