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Aaron C. Johnston-Peck, Jonathan P. Winterstein, Alan D. Roberts, Joseph S. DuChene, Kun Qian, Brendan C. Sweeny, Wei D. Wei, Renu Sharma, Eric A. Stach, Andrew A. Herzing
Lin You, Jungjoon Ahn, Yaw S. Obeng, Joseph Kopanski
We demonstrate the ability of the scanning microwave microscope (SMM) to measure the subsurface location of ungrounded. 1.2-μm wide metal lines embedded in a dielectric film. The SMM was used to image Al-Si-Cu metal lines in a test chip that were
Heayoung Yoon, Paul M. Haney, Yohan Yoon, Sang M. An, James I. Basham, Nikolai Zhitenev
We investigate local carrier dynamics in n-CdS / p-CdTe solar cells, where the electron-hole pairs are generated by either near-field optical illumination or highly focused electron beam excitation. A focused ion milling process was used to prepare a
In-situ Environmental Transmission Electron Microscopy (ETEM) experiments require specimen heating holders to study material behavior in gaseous environments at elevated temperatures. For these experiments it would be useful to have a direct measurement of
Jungseok Chae, Qingfeng Dong, Jinsong Huang, Andrea Centrone
CH3NH3PbI3-xClx perovskites enable fabrication of highly efficient solar cells. Chloride ions benefit the morphology, carrier diffusion length and stability of perovskite films; however, whether those benefits stem from the presence of Cl- in the precursor
Mihaela M. Tanase, Jonathan P. Winterstein, Renu Sharma, Vladimir A. Aksyuk, Glenn E. Holland, James A. Liddle
We demonstrate quantitative core-loss electron energy-loss spectroscopy of iron oxide nanoparticles and imaging resolution of Ag nanoparticles in liquid down to 0.24 nm, in both transmission and scanning-transmission modes, in a novel, monolithic liquid
Jose Gomez-Ballesteros, Juan Burgos, Pin A. Lin, Renu Sharma, Perla Balbuena
The dynamic evolution of nanocatalyst particle shape and carbon composition is examined through the initial stages of the single walled-carbon nanotubes chemical vapor deposition synthesis via classical reactive and ab initio molecular dynamics simulations
We demonstrate photothermally excited force modulation microscopy (PTE FMM) for mechanical property characterization across a broad frequency range with an atomic force microscope (AFM). Photothermal actuation allows for an AFM cantilever driving force
Thomas J. Silva, Justin M. Shaw, Hans T. Nembach, Mathias Weiler, Martin Schoen
The damping α of the spinwave resonances in 75 nm, 120 nm, and 200 nm -thick Permalloy films is measured via vector-network- analyzer ferromagnetic-resonance (VNA-FMR). Inductive coupling between the sample and the waveguide leads to an additional
Mark Alexander Henn, Richard M. Silver, John S. Villarrubia, Nien F. Zhang, Hui Zhou, Bryan M. Barnes, Andras Vladar, Bin Ming
Hybrid metrology, e.g. the combination of several measurement techniques to determine critical dimensions, is an important approach to meet the needs of semiconductor industry. A proper use of hybrid metrology may not only yield more reliable estimates for
June W. Lau, Jiaqi Qiu, Chunguang Jing, Sergey Baryshev, Bryan W. Reed, Yimei Zhu
A device and a method for producing ultrashort electron pulses with GHz repetition rates via pulsing an input direct current (dc) electron beam are provided. The device and the method are based on an electromagnetic-mechanical pulser (EMMP) that consists
Jing Qin, Richard M. Silver, Bryan M. Barnes, Hui Zhou, Ronald G. Dixson, Mark Alexander Henn
Quantitative optical measurements of deep sub-wavelength, three-dimensional, nanometric structures with sensitivity to sub-nanometer details address an ubiquitous measurement challenge. A Fourier domain normalization approach is used in the Fourier optical
Christina A. Hacker, Sujitra J. Pookpanratana, Curt A. Richter, Mariona Coll
In this chapter we examine the various approaches to making electrical contact to large area molecular junctions. We will highlight the experimental concerns that one must consider and the various approaches to make reliable structures and characterize the
Justin M. Gorham, William A. Osborn, Jeremiah W. Woodcock, Keana C. Scott, John M. Heddleston, Angela R. Hight Walker, Jeffrey W. Gilman
The surface contributions and dispersion properties of multiwalled carbon nanotubes (MWCNT) within a composite are important measurements to perform on nano-enabled products in order to help answer environmental health and safety questions associated with
Critical dimension atomic force microscopes (CD-AFMs) use flared tips and two-dimensional sensing and control of the tip-sample interaction to enable scanning of features with near-vertical or even reentrant sidewalls. Features of this sort are commonly
Galan A. Moody, Corey A. McDonald, Ari D. Feldman, Todd E. Harvey, Richard P. Mirin, Kevin L. Silverman
Minimizing decoherence due to coupling of a quantum system to its fluctuating environment is at the forefront of quantum information and photonics research. Nature sets the ultimate limit, however, given by the strength of the systems coupling to the
Allison B. Churnside, Ryan C. Tung, Jason P. Killgore
Viscoelastic property measurements made in liquid are key to characterizing materials for a variety of biological and industrial applications, but obtaining reliable data with nanoscale spatial resolution is challenging. Contact resonance force microscopy
Organic coatings adsorbed at a nanoparticle surface, together with the system properties, change the physicochemical properties of the nanoparticle, thereby possibly modifying its behavior and interactions with its surroundings. A detailed understanding of
Aaron M. Katzenmeyer, Glenn E. Holland, Jungseok Chae, Alan H. Band, Kevin Kjoller, Andrea Centrone
An atomic force microscope equipped with temperature sensitive probes was used to measure locally the photothermal effect induced by IR light absorption. This novel instrument opens a pathway to correlated topographical, chemical composition, and thermal
Jungseok Chae, Basudev Lahiri, John M. Kohoutek, Glenn Holland, Henri Lezec, Andrea Centrone
Plasmonic nanostructures presenting either structural asymmetry or metal-dielectric-metal (M-D-M) architecture are commonly used structures to increase the quality factor and the near-field confinement in plasmonic materials. This characteristic can be
The distance over which the resolution of a microscope image changes appreciably, related to the depth of field, is an important parameter. This value determines the height of an object that can be imaged and said to be in focus. Although this distance
Here we employ an analytical electron scattering model to show that the decrease in ADF t-SEM contrast of gold nanoparticles on carbon films is consistent with a competition between mass-thickness and atomic number contrast. Images of gold nanoparticles on