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Local photocarrier dynamics in CdTe solar cells under optical and electron beam excitations

Published

Author(s)

Heayoung Yoon, Paul M. Haney, Yohan Yoon, Sang M. An, James I. Basham, Nikolai Zhitenev

Abstract

We investigate local carrier dynamics in n-CdS / p-CdTe solar cells, where the electron-hole pairs are generated by either near-field optical illumination or highly focused electron beam excitation. A focused ion milling process was used to prepare a smooth surface and cross-sections of the devices. The spatially resolved photocurrent images confirm high carrier collection efficiencies at grain boundaries. An analytical model was used to extract material parameters at the level of single grains. We find that the minority carrier diffusion length and device parameters extracted from the local measurement techniques are in excellent agreement, but can be different determined from macro-scale measurements.
Proceedings Title
Photovoltaic Specialist Conference (PVSC), 2015 IEEE 42nd
Conference Dates
June 14-19, 2015
Conference Location
New Orleans, LA, US

Keywords

EBIC, NSOM, CdTe, Photovoltaics, grain boundary, local measurement

Citation

Yoon, H. , Haney, P. , Yoon, Y. , An, S. , Basham, J. and Zhitenev, N. (2015), Local photocarrier dynamics in CdTe solar cells under optical and electron beam excitations, Photovoltaic Specialist Conference (PVSC), 2015 IEEE 42nd, New Orleans, LA, US, [online], https://doi.org/10.1109/PVSC.2015.7356020, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=918751 (Accessed April 20, 2024)
Created December 16, 2015, Updated April 6, 2022