Strategies for transmission electron microscopy specimen preparation of polymer composites

Published: September 29, 2015

Author(s)

Keana C. Scott, Lucille A. Giannuzzi
Citation: Special Publication (NIST SP) - 1200-16
Report Number:
1200-16
Pub Type: NIST Pubs

Keywords

transmission electron microscopy, tem, focused ion beam, fib, specimen preparation, in situ, ex situ, lift out, polymer, nanocomposite
Created September 29, 2015, Updated November 10, 2018