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Mid-infrared spectroscopy beyond the diffraction limit via direct measurement of photothermal effect

Published

Author(s)

Aaron M. Katzenmeyer, Glenn E. Holland, Jungseok Chae, Alan H. Band, Kevin Kjoller, Andrea Centrone

Abstract

An atomic force microscope equipped with temperature sensitive probes was used to measure locally the photothermal effect induced by IR light absorption. This novel instrument opens a pathway to correlated topographical, chemical composition, and thermal mapping with nanoscale resolution. Proof of principle demonstration is provided on polymers and plasmonic samples.
Citation
Nanoscale
Volume
7
Issue
42

Keywords

nanoscale chemical imaging, thermal conductivity, AFM

Citation

Katzenmeyer, A. , Holland, G. , Chae, J. , Band, A. , Kjoller, K. and Centrone, A. (2015), Mid-infrared spectroscopy beyond the diffraction limit via direct measurement of photothermal effect, Nanoscale, [online], https://doi.org/10.1039/C5NR04854K (Accessed February 24, 2024)
Created September 30, 2015, Updated November 10, 2018