Gokhale, V.
and Gorman, J.
(2016),
Dynamic characterization of in-plane bulk acoustic resonators using high-sensitivity optical reflection measurements, Hilton Head Workshop 2016: A Solid-State Sensors, Actuators and Microsystems Workshop, Hilton Head, SC, US, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=920711
(Accessed October 12, 2025)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Dynamic characterization of in-plane bulk acoustic resonators using high-sensitivity optical reflection measurements
Published
Author(s)
,
Abstract
A combination of optical knife-edge and photoelastic modulation measurement techniques are presented, which are used to measure dynamic displacement and strain at various points on in-plane bulk acoustic resonators. These techniques can characterize in-plane high-frequency vibration with a degree of precision and simplicity that has not been shown previously. The measurements are spatially resolved and can be used to reconstruct the vibrational mode shape of the resonator. Experimental results presented here are acquired using both methods on a pure silicon bulk acoustic resonator (SiBAR) with a fundamental resonance frequency of 13.6 MHz.Proceedings Title
Hilton Head Workshop 2016: A Solid-State Sensors, Actuators and Microsystems Workshop
Conference Dates
June 6-9, 2016
Conference Location
Hilton Head, SC, US
Pub Type
Conferences
Download Paper
Keywords
Microelectromechanical systems, resonator, modal analysis, knife-edge, photoelastic effect
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact [email protected].
Created June 4, 2016, Updated April 18, 2022