Gokhale, V.
and Gorman, J.
(2016),
Dynamic characterization of in-plane bulk acoustic resonators using high-sensitivity optical reflection measurements, Hilton Head Workshop 2016: A Solid-State Sensors, Actuators and Microsystems Workshop, Hilton Head, SC, US, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=920711
(Accessed April 26, 2024)
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Dynamic characterization of in-plane bulk acoustic resonators using high-sensitivity optical reflection measurements
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Abstract
A combination of optical knife-edge and photoelastic modulation measurement techniques are presented, which are used to measure dynamic displacement and strain at various points on in-plane bulk acoustic resonators. These techniques can characterize in-plane high-frequency vibration with a degree of precision and simplicity that has not been shown previously. The measurements are spatially resolved and can be used to reconstruct the vibrational mode shape of the resonator. Experimental results presented here are acquired using both methods on a pure silicon bulk acoustic resonator (SiBAR) with a fundamental resonance frequency of 13.6 MHz.Proceedings Title
Hilton Head Workshop 2016: A Solid-State Sensors, Actuators and Microsystems Workshop
Conference Dates
June 6-9, 2016
Conference Location
Hilton Head, SC, US
Pub Type
Conferences
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Keywords
Microelectromechanical systems, resonator, modal analysis, knife-edge, photoelastic effect
Citation
Created June 4, 2016, Updated April 18, 2022