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Displaying 901 - 925 of 940

Standard Test Data for Estimating Peak Parameter Errors in X-Ray Photoelectron Spectroscopy: I. Results for Peak Binding Energies

October 1, 1998

Author(s)

Joseph M. Conny, Cedric J. Powell, Lloyd A. Currie

Standard test data(STD) are simulations of analytical instrument responses that help determine the veracity of computer-based, data analysis procedures that are typically used with instruments. The STD were developed for determining errors in peak

Quantitative secondary ion mass spectrometry imaging of self-assembled monolayer films for electron beam dose mapping in the environmental scanning electron microscope

July 1, 1998

Author(s)

John G. Gillen, Scott A. Wight, David S. Bright, T M. Herne

Fluorinated alkanethiol self assembled monolayers (SAM) films immobilized on gold substrates have been used as electron-sensitive resists to map quantitatively the spatial distribution of the primary electron beam scattering in an environmental scanning

Atomic Hydrogen for the Formation of Abrupt Sb Doping Profiles in MBE-Grown Si

May 1, 1998

Author(s)

P E. Thompson, C Silvestre, M E. Twigg, G Jernigan, David S. Simons

Previously atomic hydrogen has been shown to be effective in reducing the segregation of Ge on Si[100] during solid source molecular beam epitaxygrowth. In this work we have investigated atomic hydrogen to determine if it is equally effective in reducing

Isotopic Distributions in Particle Populations

April 1, 1998

Author(s)

Cynthia J. Zeissler

Better Visualization Inside the Environmental Scanning Electron Microscope Through the Infrared Chamberscope Coupled with a Mirror

December 1, 1997

Author(s)

Scott A. Wight

Comparison of Semiconductor Pixel Array, Phosphor Plate, and Track-Etch Detectors for Alpha Autoradiography

December 1, 1997

Author(s)

Cynthia J. Zeissler

Development of Environmental Scanning Electron Microscopy Electron Beam Profile Imaging with Self-Assembled Monolayers and Secondary Ion Mass Spectroscopy

December 1, 1997

Author(s)

Scott A. Wight, G Gillen, T M. Herne

Dynamics and Free Energy of Polymers Partitioning into a Nanoscale Pore

December 1, 1997

Author(s)

S. M. Bezrukov, I Vodyanoy, R A. Brutyan, J. J. Kasianowicz

Effect of Ge on the Segregation of B in Si(100) and Si(110)

December 1, 1997

Author(s)

P E. Thompson, C Silvestre, G Jernigan, K D. Hobart, David S. Simons, M Gregg

Environmental SEM Electron Damage Imaging of Self Assembled Monolayers with SIMS

December 1, 1997

Author(s)

Scott A. Wight, G Gillen, T M. Herne

Indium Diffusion in n-type Gallium Arsenide

December 1, 1997

Author(s)

W M. Li, R M. Cohen, David S. Simons, P Chi

Measurement of ESEM Electron Beam Profiles with Self-Assembled Monolayers and SIMS

December 1, 1997

Author(s)

Scott A. Wight, G Gillen, T M. Herne

Microhotplate Chemical Vapor Deposition in the Environmental SEM Chamber

December 1, 1997

Author(s)

Scott A. Wight, Richard E. Cavicchi, M J. Nystrom, F DiMeo

SIMS Imaging of Electron Beam Scattering in the Environmental SEM

December 1, 1997

Author(s)

Scott A. Wight, G Gillen, T M. Herne

The Scanning Scattering Microscopy for Surface and Buried Interface Roughness and Defect Imaging

December 1, 1997

Author(s)

J Lorincik, J Fine, J Greg Gillen

Carbonization Rate of Soot Precursor Particles

December 1, 1996

Author(s)

R A. Dobbins, G J. Govatzidakis, W Lu, A F. Schwartzman, Robert A. Fletcher

Formation of Shallow Junctions During Rapid Thermal Processing from Electron-Beam Deposited Boron Sources

December 1, 1996

Author(s)

W Zagozdzon-wosik, K Korablev, I Rusakova, David S. Simons, J H. Shi, P Chi, J C. Wolfe

Intensity Measurement of Wavelength Dispersive X-Ray Emission Bands: Applications to the Soft X-Ray Region

December 1, 1996

Author(s)

G Redmond, C Gilles, M Fialin, O Rouer, Ryna B. Marinenko, Robert L. Myklebust, Dale Newbury

The Role of Inclusions in U-Pb and Sm-Nd Garnet Geochronology: Stepwise Dissolution Experiments and Grace Uranium Mapping by Fission Track Analysis

January 1, 1996

Author(s)

C.P. Dewolf, Cynthia J. Zeissler, A.N. Halliday, K. Mezger, E.J. Essene

The U-Pb and Sm-Nd dating of garnet are important tools for understanding rates of tectonometamorphic processes and have been widely applied in studies of metamorphic terranes. However, the budgets of uranium, lead, samarium, and neodymium in garnet

The Development of Standard Reference Material 2137 - A Boron Implant in Silicon Standard for Secondary Ion Mass Spectrometry

December 1, 1995

Author(s)

David S. Simons, P Chi, Robert G. Downing, George P. Lamaze

Use of Secondary Ion Mass Spectrometry to Image (44) Calcium Uptake in the Cell Walls of Apple Fruit

September 1, 1995

Author(s)

Sandip Roy, J Greg Gillen, W.S. Conway, A.E. Watada, W.P. Wergin

Prompt Gamma Activation Analysis Enhanced by a Neutron Focusing Capillary Lens

January 1, 1995

Author(s)

H. Chen, David F. Mildner, Robert Gregory Downing, R.L. Paul, Richard M. Lindstrom, Cynthia J. Zeissler, Q.F. Xiao, V.A. Sharov

Particle Analysis: Sample Preparation

May 17, 1994

Author(s)

Cynthia J. Zeissler

Patterning of Self-assembled Alkanethiol Monolayers on Silver by Microfocus Ion and Electron Beam Bombardment

April 1, 1994

Author(s)

John G. Gillen, Scott A. Wight, Joe Bennett, Michael J. Tarlov

Decanethiol [CH3(CH2)9SH] self-assembled monolayer films on silver substrates have been irradiated in selected areas by focused ion or electron bombardment. Subsequent immersion of the irradiated sample in a solution of a fluoromercaptan [CF3(CF2)2(CH2)2SH

Molecular Imaging Secondary Ion Mass Spectrometry for the Characterization of Patterned Self-assembled Monolayers on Silver and Gold

January 1, 1994

Author(s)

John G. Gillen, J. Bennett, Michael J. Tarlov, Donald R. Burgess Jr.

Self-assembly of alkanethiol monolayers on gold and silver substrates is a fast, easy, and convenient method for preparing stable organic films with well-defined physical and chemical properties that can be modified by changing the terminal functional